Examiner Jean Baptiste Wilner

2899-JEAN-BAPTISTE-WILNER

Employment Information

Art Unit:2899 — Active solid-state devices (e.g., transistors, solid-state diodes)
Group:28XX — Semiconductors B
Classes: 257 — Active solid-state devices (e.g., transistors, solid-state diodes)
438 — Semiconductor device manufacturing: process
174 — Electricity: conductors and insulators
277 — Seal for a joint or juncture
219 — Electric heating
156 — Adhesive bonding and miscellaneous chemical manufacture
378 — X-ray or gamma ray systems or devices
Phone:(571) 270-7394
Email:wilner.jeanbaptiste@uspto.gov
Location:VA 22314
Title:Pat Examnr Elctrl Engrg
Service:18 years
Grade:GS-13

Grant Rate and Difficulty Ranking

10
3-Year Grant rate: 93% over 435 cases
Difficulty: Extremely Easy
Difficulty Percentile: 10th

With Examiner Jean, you have a 93% chance of getting an issued patent by 3 years after the first office action. Examiner Jean is an extremely easy examiner and in the 10th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Jean, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2899

Examiner Jean's grant rate is higher than that of Art Unit 2899 and higher than that of the USPTO.

Average Office Actions Per Grant
Examiner Jean 1.2
Art Unit 2899 1.2

Interview Benefit

Grant Rate without Interview

Examiner Jean has granted 340 of 361 cases without any applicant-requested interviews for a grant rate of 94%.

Grant Rate with Interview

Examiner Jean has granted 64 of 74 cases with at least one applicant-requested interview for a grant rate of 86%.

Interview Benefit

With Examiner Jean, conducting an interview decreases your chance of getting a patent granted by 9%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
17699028 Microelectronic Structure Including Active Base Substrate With Through Vias Between A Top Die And A Bottom Die Supported On An Interposer Rejection information available with a Premium Stats subscription. See our pricing. Patented View
18225286 Grain Structure Engineering For Metal Gapfill Materials Patented View
18190206 Compensation Method For Wafer Bonding Patented View
17946883 Stacked Semiconductor Method And Apparatus Patented View
17728625 Methods And Apparatus For Integrating Carbon Nanofiber Into Semiconductor Devices Using W2w Fusion Bonding Patented View
18402755 Apparatus Including Integrated Segments And Methods Of Manufacturing The Same Patented View
17970964 Manufacturing Method Of Diamond Composite Wafer Patented View
18140960 Semiconductor Package And Method Of Manufacturing Same Patented View
18249351 Method And Device For Producing A Semiconductor Component Patented View
17891601 Semiconductor Manufacturing Device And Method Of Manufacturing Semiconductor Device Patented View
18076210 Via Formed Using A Partial Plug That Stops Before A Substrate Patented View
18151663 Adding Sealing Material To Wafer Edge For Wafer Bonding Patented View
17980571 Semiconductor Package And Fabrication Method Thereof Patented View
18108984 Module With Gas Flow-Inhibiting Sealing At Module Interface To Mounting Base Patented View
18188621 Die Bonding Tool With Tiltable Bond Head For Improved Bonding And Methods For Performing The Same Patented View
17895047 Semiconductor Structure And Method Of Forming The Same Patented View
17889914 Perpendicular Semiconductor Device Assemblies And Associated Methods Patented View
18123967 Method For Manufacturing Semiconductor Package Structure Patented View
17820306 Semiconductor Device And Method Of Manufacturing Semiconductor Device Patented View
17891949 Package Structures And Methods Of Manufacturing The Same Patented View
18738707 Methods Of Reducing Parasitic Capacitance In Semicondutor Devices Patented View
18593775 Hybrid Backside Thermal Structures For Enhanced Ic Packages Patented View
18485291 Semiconductor Device Patented View
17934346 Thermally Enhanced Chip-On-Wafer Or Wafer-On-Wafer Bonding Patented View
18544747 Integrated Circuit Chip Including A Passivation Nitride Layer In Contact With A High Voltage Bonding Pad And Method Of Making Patented View
17876518 Integrated Antennas On Side Wall Of 3d Stacked Die Patented View
17962131 Semiconductor Die Having An Optical Detection Marker And Method Of Producing The Semiconductor Die Patented View
18772247 Package Structures Patented View
17952925 Semiconductor Package Having Improved Heat Dissipation Characteristics Patented View
17743999 Semiconductor Package And Method Of Forming Same Patented View
17857967 Systems And Methods For Direct Bonding In Semiconductor Die Manufacturing Patented View
17896638 Semiconductor Package, And Method Of Manufacturing The Same Patented View
18076364 Integrated Mechanical Aids For High Accuracy Alignable-Electrical Contacts Patented View
17931796 Manufacturing Method Of Semiconductor Chip Patented View
17890734 Conductive Adhesive Assembly For Semiconductor Die Attachment Patented View
18520996 Source/drain Metal Contact And Formation Thereof Patented View
18509801 Seal Ring Designs Supporting Efficient Die To Die Routing Patented View
17885952 Light-Emitting Device And Lighting Apparatus Patented View
18615151 Semiconductor Device And Method Of Manufacturing The Same, And Electronic Apparatus Patented View
18771052 Semiconductor Device And Method Of Manufacturing The Same, And Electronic Apparatus Patented View
18643474 Interposer, Method For Fabricating The Same, And Semiconductor Package Having The Same Patented View
18106883 Bonding And Transferring Method For Die Package Structures Patented View
17811654 Semiconductor Memory Device And Method Of Manufacturing The Same Patented View
17651312 Semiconductor Device Patented View
18508807 Semiconductor Package Patented View
17888529 Semiconductor Package Including Reinforcement Structure And Methods Of Forming The Same Patented View
18668941 Solid-State Imaging Device And Electronic Apparatus Patented View
18447467 Circuit Devices With Gate Seals Patented View
17885291 Testing Memory Of Wafer-On-Wafer Bonded Memory And Logic Patented View
17836142 Semiconductor Packages Patented View

Appeals Statistics

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