1. Stats
  2. USPTO
  3. TC 2800
  4. Group 28XX
  5. Art Unit 2893
  6. Examiner Cieslewicz

Examiner Cieslewicz Aneta B

2893-CIESLEWICZ-ANETA-B

Employment Information

Art Unit:2893 — Active solid-state devices (e.g., transistors, solid-state diodes)
Group:28XX — Semiconductors B
Classes: 257 — Active solid-state devices (e.g., transistors, solid-state diodes)
438 — Semiconductor device manufacturing: process
361 — Electricity: electrical systems and devices
702 — Data processing: measuring, calibrating, or testing
Phone:(303) 297-4232
Email:aneta.cieslewicz@uspto.gov
Location:CO 80294
Title:Pat Examnr Elctrl Engrg
Service:12 years
Grade:GS-12

Grant Rate and Difficulty Ranking

73
3-Year Grant rate: 59% over 105 cases
Difficulty: Harder
Difficulty Percentile: 73rd

With Examiner Cieslewicz, you have a 59% chance of getting an issued patent by 3 years after the first office action. Examiner Cieslewicz is a harder examiner and in the 73rd percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Cieslewicz, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2893

Examiner Cieslewicz's grant rate is lower than that of Art Unit 2893 and lower than that of the USPTO.

Average Office Actions Per Grant
Examiner Cieslewicz 2.6
Art Unit 2893 1.3

Interview Benefit

Grant Rate without Interview

Examiner Cieslewicz has granted 49 of 74 cases without any applicant-requested interviews for a grant rate of 66%.

Grant Rate with Interview

Examiner Cieslewicz has granted 13 of 31 cases with at least one applicant-requested interview for a grant rate of 42%.

Interview Benefit

With Examiner Cieslewicz, conducting an interview decreases your chance of getting a patent granted by 36%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
17145500 Multiple Patterning With Selective Mandrel Formation Rejection information available with a Premium Stats subscription. See our pricing. Patented View
17563607 Conformal Dielectric Cap For Subtractive Vias Patented View
17795548 Display Panel And Display Device Patented View
17864353 Electronic Device Abandoned View
17848050 Integrated Electronic Device With A Pad Structure Including A Barrier Structure And Related Manufacturing Process Abandoned View
17871882 Method For Manufacturing Semiconductor Device Patented View
16964167 Display Device Patented View
16454178 High K Metal Gate Stack With Single Work-Function Metal Abandoned View
17759134 Semiconductor Device Abandoned View
17155520 Semiconductor Package With Wettable Flank Patented View
18523716 Display Device Patented View
17489910 Integration Scheme To Build Resistor, Capacitor, Efuse Using Silicon-Rich Dielectric Layer As A Base Dielectric Patented View
18806478 Hermetic Microelectronic Module Using A Sheath Patented View
17590611 Flexible Display Apparatus And Method Of Manufacturing The Same Patented View
17873159 Semiconductor Device, Biosensor, Biosensor Array, And Logic Circuit Patented View
18221420 Display Panel And Display Device Patented View
17246856 Light Emitting Diode Patented View
17202675 Ruthenium Etching Process Abandoned View
17069513 Semiconductor Devices And Methods Of Manufacturing Semiconductor Devices Patented View
17317229 Organic Light-Emitting Display Apparatus Patented View
17121320 Thin Film Transistor And Display Device Including The Same Patented View
16782882 Replacement Buried Power Rail In Backside Power Delivery Patented View
17245519 Semiconductor Device And A Method Of Manufacture Patented View
18178660 Semiconductor Device And Method Patented View
16983059 Silicon Member And Method Of Producing The Same Abandoned View
17894579 Semiconductor Device And Method Of Manufacturing The Same Patented View
17353547 Method For Manufacturing Semiconductor Device Patented View
18295627 Electroluminescent Display Device Patented View
16475287 Power Semiconductor Device And Method For Manufacturing Power Semiconductor Device Patented View
17808709 Mechanisms For Forming Finfet Device Patented View
17833099 Semiconductor Device With Patterned Ground Shielding Patented View
17655832 Method For Manufacturing Ferromagnetic-Dielectric Composite Material Patented View
16186404 Semiconductor Nanoparticles, And Display Device And Oled Display Device Comprising The Same Abandoned View
15157197 Through-Dielectric-Vias (Tdvs) For 3d Integrated Circuits In Silicon Patented View
17183814 Method Of Manufacturing Semiconductor Device Abandoned View
16966116 Touch Array Substrate And Manufacturing Method Thereof Patented View
15410312 Light-Emitting Panel, Display Device, And Method For Manufacturing Light-Emitting Panel Abandoned View
17117283 Leadframe Package With Adjustable Clip Patented View
17658335 Tiled Lateral Thyristor Patented View
17099979 Thin Semiconductor Package And Manufacturing Method Thereof Abandoned View
16924200 Semiconductor Structure And Methods Of Forming The Same Patented View
17138741 Reliable Semiconductor Packages Abandoned View
16990516 Light-Emitting Device And Display Apparatus Including The Same Patented View
16514480 Display Apparatus Patented View
17152084 Power Module With Vascular Jet Impingement Cooling System Abandoned View
15759698 Coating Liquid For Forming N-Type Oxide Semiconductor Film, Method For Producing N-Type Oxide Semiconductor Film, And Method For Producing Field-Effect Transistor Patented View
17495606 Encapsulation Cover For An Electronic Package And Fabrication Process Abandoned View
16973161 Display Substrate And Manufacturing Method Thereof, Display Panel And Display Apparatus Patented View
16758371 Carrier, Assembly Comprising A Substrate And A Carrier, And Method For Producing A Carrier Patented View
17123576 Method Of Metalizing A Glass Article Patented View

Appeals Statistics

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