1. Stats
  2. USPTO
  3. TC 2800
  4. Group 2810-2820
  5. Art Unit 2827
  6. Examiner Nguyen

Examiner Nguyen Viet Q

2827-NGUYEN-VIET-Q

Employment Information

Art Unit:2827 — Static information storage and retrieval
Group:2810-2820 — Semiconductors A/Memory
Classes: 365 — Static information storage and retrieval
711 — Electrical computers and digital processing systems: memory
257 — Active solid-state devices (e.g., transistors, solid-state diodes)
714 — Error detection/correction and fault detection/recovery
712 — Electrical computers and digital processing systems: processing architectures and instruction processing (e.g., processors)
706 — Data processing: artificial intelligence
361 — Electricity: electrical systems and devices
700 — Data processing: generic control systems or specific applications
414 — Material or article handling
327 — Miscellaneous active electrical nonlinear devices, circuits, and systems
Phone:(571) 272-1788
Email:viet.nguyen3@uspto.gov
Location:VA 22314
Title:Pat Examnr Elctrl Engrg
Service:40 years
Grade:GS-14

Grant Rate and Difficulty Ranking

2
3-Year Grant rate: 98% over 555 cases
Difficulty: Extremely Easy
Difficulty Percentile: 2nd

With Examiner Nguyen, you have a 98% chance of getting an issued patent by 3 years after the first office action. Examiner Nguyen is an extremely easy examiner and in the 2nd percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Nguyen, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2827

Examiner Nguyen's grant rate is higher than that of Art Unit 2827 and higher than that of the USPTO.

Average Office Actions Per Grant
Examiner Nguyen 0.9
Art Unit 2827 0.9

Interview Benefit

Grant Rate without Interview

Examiner Nguyen has granted 488 of 499 cases without any applicant-requested interviews for a grant rate of 98%.

Grant Rate with Interview

Examiner Nguyen has granted 56 of 56 cases with at least one applicant-requested interview for a grant rate of 100%.

Interview Benefit

With Examiner Nguyen, conducting an interview increases your chance of getting a patent granted by 2%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
18548035 Storage Device, Method For Manufacturing The Same, And Electronic Device Including Storage Device Rejection information available with a Premium Stats subscription. See our pricing. Patented View
18103316 Multi-Stack Bitcell Architecture Patented View
17854130 Semiconductor Device Patented View
18415703 Nonvolatile Memory With Temperature-Dependent Sense Time Offsets For Soft-Bit Read Patented View
18602059 Non-Volatile Memory And Associated Control Method Patented View
18442943 On-Die Capacitor Banks Patented View
18346736 Read-Only Memory Method, Layout, And Device Patented View
18419557 Semiconductor Device Abandoned View
18736883 Memory Controller Useable For A Dynamic Random Access Memory (Dram) Health Monitor Patented View
18358638 Integrated Memory And Control Dies Patented View
18493692 Main Wordline Decoding Circuitry Patented View
17884299 Merged Cavities And Buried Etch Stops For Three-Dimensional Memory Arrays Patented View
18732004 Memory Device And Operating Method Thereof Patented View
18404411 Voltage Supply Circuit, Memory Device Including The Same, And Operating Method Of Memory Device Patented View
18392745 Decoder Circuits, Memory Devices And Its Control Method Patented View
17885269 Input/output Connections Of Wafer-On-Wafer Bonded Memory And Logic Patented View
18240516 Memory Device Patented View
18731731 Semiconductor Device Patented View
18526281 Llc Chip, Cache System And Method For Reading And Writing Llc Chip Patented View
18507444 Embedded Memory Device, Integrated Circuit Having The Same And Method Of Operating The Same Patented View
18344812 Rc-Tuned Wordline Underdrive Circuit Patented View
18757302 Memory With Redundant Read Optimization Patented View
18662519 Memory Device, Operation Method, And Memory System Patented View
18584118 Semiconductor Device Patented View
18381115 Memory Device Patented View
18531872 Memory Device And Operating Method Thereof Patented View
18672623 One-Time-Programmable Memory Patented View
18474518 Ram And Short-Circuit Detection System Abandoned View
18635268 Random Access Memory And Method Of Fabricating The Same Patented View
18150164 Semiconductor Device And Semiconductor Memory Device Patented View
18353116 Three-Dimensional Integrated Circuit Patented View
18387204 Non-Volatile Memory Device And Control Method Patented View
18211718 One-Time Programmable Memory Device Patented View
18361478 Semiconductor Element Memory Device Abandoned View
18619444 Semiconductor Device Including Memory Element Abandoned View
18420171 Ferroelectric Fet-Based Content-Addressable Memory Patented View
18609167 Memory Device Using Semiconductor Element Abandoned View
18442709 Real Time Ramp Rate Adjustment For Better Performance And Current Consumption Tradeoff Patented View
18440928 Magnon Junction, Magnon Random Access Memory, Magnon Microwave Oscillator And Detector, Electronic Device Patented View
18393416 Microelectronic Devices And Memory Devices Patented View
18534834 Method For Controlling Nand Flash Memory To Implement Xnor Operation Patented View
18258405 Resistance Change Memory, Memory Device, And Memory System Patented View
18325730 Memory Device Performing Read Operation And Method Of Operating The Same Patented View
17887372 Repeater Scheme For Inter-Die Signals In Multi-Die Package Patented View
18405926 Puf Memory Devices And Methods Of Manufacturing Thereof Patented View
18435286 System And Method For Improving Safety Of Integrated Circuits Patented View
17399925 Voltage Detector For Supply Ramp Down Sequence Patented View
18770397 Methods For Reading Resistive States Of Resistive Change Elements Abandoned View
18381568 Extending Functionality Of Memory Controllers Using A Loopback Mode For Testing In A Processor-Based Device Patented View
18520130 Memory-Element-Including Semiconductor Device Abandoned View

Appeals Statistics

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