| Examiner | Number of Cases | 3YGR |
|---|---|---|
| Examiner Coon | 29 | 0% |
| Examiner Dinh | 545 | 95% |
| Examiner Hampton | 0 | 0% |
| Examiner Heisterkamp | 0 | 0% |
| Examiner Hidalgo | 569 | 97% |
| Examiner Ho | 458 | 97% |
| Examiner Hoang | 501 | 97% |
| Examiner Huang | 468 | 93% |
| Examiner King | 0 | 0% |
| Examiner Lappas | 446 | 98% |
| Examiner Le | 536 | 99% |
| Examiner Nguyen | 555 | 98% |
| Examiner Pham | 465 | 94% |
| Examiner Radke | 417 | 95% |
| Examiner Tang | 0 | 0% |
| Examiner Techane | 382 | 95% |
| Examiner Tran | 621 | 98% |
| Examiner Zarabian (SPE) | 15 | 80% |
| Art Unit 2827 | 6007 | 96% |
| Number | Class Description |
|---|---|
| 365 | Static information storage and retrieval |
| 711 | Electrical computers and digital processing systems: memory |
| 706 | Data processing: artificial intelligence |
| 257 | Active solid-state devices (e.g., transistors, solid-state diodes) |
| 700 | Data processing: generic control systems or specific applications |
| 702 | Data processing: measuring, calibrating, or testing |
| 714 | Error detection/correction and fault detection/recovery |
| 713 | Electrical computers and digital processing systems: support |
| 438 | Semiconductor device manufacturing: process |
| 710 | Electrical computers and digital data processing systems: input/output |
Art Unit 2827's grant rate is higher than that of Group 2810-2820 and higher than that of the USPTO.
Below is the grant rate timeline for Art Unit 2827, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.
Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.