1. Stats
  2. USPTO
  3. TC 2800
  4. Group 28XX
  5. Art Unit 2891
  6. Examiner Anya

Examiner Anya Igwe U

2891-ANYA-IGWE-U

Employment Information

Art Unit:2891 — Active solid-state devices (e.g., transistors, solid-state diodes)
Group:28XX — Semiconductors B
Classes: 257 — Active solid-state devices (e.g., transistors, solid-state diodes)
438 — Semiconductor device manufacturing: process
702 — Data processing: measuring, calibrating, or testing
365 — Static information storage and retrieval
159 — Concentrating evaporators
361 — Electricity: electrical systems and devices
428 — Stock material or miscellaneous articles
Phone:(571) 272-1887
Email:igwe.anya@uspto.gov
Location:VA 22314
Title:Pat Examnr Physics
Service:27 years
Grade:GS-14

Grant Rate and Difficulty Ranking

6
3-Year Grant rate: 95% over 434 cases
Difficulty: Extremely Easy
Difficulty Percentile: 6th

With Examiner Anya, you have a 95% chance of getting an issued patent by 3 years after the first office action. Examiner Anya is an extremely easy examiner and in the 6th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Anya, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2891

Examiner Anya's grant rate is higher than that of Art Unit 2891 and higher than that of the USPTO.

Average Office Actions Per Grant
Examiner Anya 0.9
Art Unit 2891 1.3

Interview Benefit

Grant Rate without Interview

Examiner Anya has granted 402 of 422 cases without any applicant-requested interviews for a grant rate of 95%.

Grant Rate with Interview

Examiner Anya has granted 11 of 12 cases with at least one applicant-requested interview for a grant rate of 92%.

Interview Benefit

With Examiner Anya, conducting an interview decreases your chance of getting a patent granted by 3%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
17808561 Mram Device With Self-Aligned Bottom Electrodes Rejection information available with a Premium Stats subscription. See our pricing. Patented View
17818173 Semiconductor Device And Method Of Manufacturing The Same Patented View
17960064 Electronic Device Comprising Transistors Patented View
18055843 Semiconductor Device Patented View
18788160 High Electron Mobility Transistor And Method For Fabricating The Same Patented View
18192683 Power Mosfet And Manufacturing Method Thereof Patented View
18453482 Semiconductor Module Patented View
17993467 Insulated Gate Semiconductor Device Patented View
18353250 Semiconductor Device And Method Of Manufacturing The Same Patented View
18257038 Semiconductor Device Patented View
17952350 Electronic Device Patented View
18177478 Manufacturing Method Of Semiconductor Device Patented View
18234344 Semiconductor Device Patented View
17739682 Image Sensor Patented View
18172348 Semiconductor Device Patented View
17879902 Resonant Cavity Micro-Led Array Using Embedded Reflector Patented View
18353758 Semiconductor Device Patented View
17837683 Display Device And Method Of Fabricating The Same Patented View
18176547 Super-Junction Device Patented View
18342372 Silicon Carbide Semiconductor Device And Method Of Manufacturing Silicon Carbide Semiconductor Device Patented View
18008448 Silicon Carbide Semiconductor Device And Power Converter Patented View
17819679 Semiconductor Devices Including Backside Power Via And Methods Of Forming The Same Patented View
18362805 Three-Dimensional Memory Device With Laterally Separated Source Select Electrodes And Methods Of Forming The Same Patented View
18331436 Semiconductor Device Structure And Method For Forming The Same Patented View
18076400 Semiconductor Device Patented View
18054996 Semiconductor Device And Method Of Manufacturing The Same Abandoned View
18336707 Semiconductor Device With Esd Protection Structure And Method Of Making Same Abandoned View
18302773 Semiconductor Device Patented View
18091425 Semiconductor Device Abandoned View
18147046 Semiconductor Device Patented View
17891132 Method For Manufacturing Light-Emitting Device Patented View
17743510 Semiconductor Device Structure And Methods Of Forming The Same Patented View
18062862 Semiconductor Apparatus Patented View
17781908 Semiconductor Element And Electronic Apparatus Patented View
17993313 Semiconductor Device And Method Of Manufacturing The Same Patented View
18299372 Trench Type Silicon Carbide Mosfet Structure And Preparation Method Thereof Patented View
17639316 Array Substrate, Method For Manufacturing Array Substrate And Display Device Patented View
18183903 Semiconductor Devices Patented View
17751727 Transistor With Controllable Source/drain Structure Patented View
18027212 Display Substrate, Method For Repairing Same, Method For Preparing Same, And Display Device Patented View
18830089 Semiconductor Device Patented View
18249282 Semiconductor Device Patented View
18188452 Semiconductor Device Patented View
18187852 Semiconductor Cell Structure, Igbt Cell Structure, Semiconductor Structure, And Method For Manufacturing Igbt Cell Structure Patented View
18172498 Semiconductor Device And Method Of Manufacturing The Same Patented View
18164426 Semiconductor Device Patented View
18155520 Silicon Carbide Semiconductor Device Patented View
17651721 Transistor Source/drain Contacts And Methods Of Forming The Same Patented View
18640126 Methods And Structures For Contacting Shield Conductor In A Semiconductor Device Patented View
18122726 Semiconductor Device And Fabrication Method Thereof Patented View

Appeals Statistics

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