Examiner Hollweg Thomas A (SPE)

2874-HOLLWEG-THOMAS-A

Employment Information

Art Unit:2874 — Optical waveguides
Group:28XX — Semiconductors B
Classes: 385 — Optical waveguides
313 — Electric lamp and discharge devices
398 — Optical communications
706 — Data processing: artificial intelligence
Phone:(571) 270-1739
Email:thomas.hollweg@uspto.gov
Location:VA 22314
Title:Supvy Pat Examnr Physics
Service:20 years
Grade:GS-15

Grant Rate and Difficulty Ranking

98
3-Year Grant rate: 0% over 10 cases
Difficulty: Extremely Hard
Difficulty Percentile: 98th

With Examiner Hollweg (SPE), you have a 0% chance of getting an issued patent by 3 years after the first office action. Examiner Hollweg (SPE) is an extremely hard examiner and in the 98th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Hollweg (SPE), where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2874

Examiner Hollweg (SPE)'s grant rate is lower than that of Art Unit 2874 and lower than that of the USPTO.

Average Office Actions Per Grant
Examiner Hollweg (SPE) 1.2
Art Unit 2874 1.1

Interview Benefit

Purchase Subscription

Subscribe to Premium Examiner Statistics for unlimited access to our examiner statistics.

Recent Dispositions

Purchase Subscription

Subscribe to Premium Examiner Statistics for unlimited access to our examiner statistics.

Appeals Statistics

Purchase Subscription

Subscribe to Premium Examiner Statistics for unlimited access to our examiner statistics.

Appeal History

Purchase Subscription

Subscribe to Premium Examiner Statistics for unlimited access to our examiner statistics.

Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.

Loading...