Examiner Maini Rahul

2858-MAINI-RAHUL

Employment Information

Art Unit:2858 — Electricity: measuring and testing
Group:2850-2860 — Printing/Measuring and Testing
Classes: 324 — Electricity: measuring and testing
700 — Data processing: generic control systems or specific applications
429 — Chemistry: electrical current producing apparatus, product, and process
356 — Optics: measuring and testing
348 — Television
Phone:(571) 270-1099
Email:rahul.maini@uspto.gov
Location:VA 22314
Title:Pat Examnr Elctrl Engrg
Service:11 years
Grade:GS-12

Grant Rate and Difficulty Ranking

50
3-Year Grant rate: 77% over 226 cases
Difficulty: Medium
Difficulty Percentile: 50th

With Examiner Maini, you have a 77% chance of getting an issued patent by 3 years after the first office action. Examiner Maini is a medium examiner and in the 50th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Maini, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2858

Examiner Maini's grant rate is lower than that of Art Unit 2858 and lower than that of the USPTO.

Average Office Actions Per Grant
Examiner Maini 1.2
Art Unit 2858 1.1

Interview Benefit

Grant Rate without Interview

Examiner Maini has granted 148 of 194 cases without any applicant-requested interviews for a grant rate of 76%.

Grant Rate with Interview

Examiner Maini has granted 27 of 32 cases with at least one applicant-requested interview for a grant rate of 84%.

Interview Benefit

With Examiner Maini, conducting an interview increases your chance of getting a patent granted by 11%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
17917019 Method For Diagnosing Failure Of Current Breaking Device And Energy Storage Apparatus Rejection information available with a Premium Stats subscription. See our pricing. Patented View
17076088 Integrated Circuit Testing System And Method Patented View
17728063 Magnetic Resonance Methods And Devices For Characterizing A Pattern Of Flow Of A Fluid Patented View
19103823 Eddy Current Testing Circuit, Method And System, Storage Medium, And Terminal Patented View
18097962 Data-Driven Constrained Model For Corrosion Inspection Tools Patented View
18545448 Eddy Current Sensor, Polishing Apparatus, And Film Thickness Detection Method Patented View
18102500 Magnetic Resonance Methods And Devices For Characterizing Rheological Properties Of A Fluid Patented View
18575819 Magnetic Field Sensor Head And Magnetic Field Sensor Device Abandoned View
18434034 Magnetizers For Pigging Tools Having Rotational Elements Patented View
18235267 Power Device Threshold Voltage Measurement Circuit And Operation Method Thereof Patented View
18206192 Aging Proof Delay Circuit Patented View
18461810 Multi-Turn Birdcage Mri Coil And Applications Patented View
18183710 Multiphase Power-Harvesting Sensor Devices And Systems Patented View
18409599 Hydrogen Sensor Patented View
18014844 Fluid Monitoring System For Monitoring A Presence Or A Condition Of A Fluid Using Its Permittivity And Method Therefore Patented View
19169043 Signal Saturation Method For Achieving Spatial Selection Under Non-Uniform Field, And Medium Patented View
18017336 Method And System For Testing A Printed Circuit Board Patented View
18180914 Platform For Precise Thermal Regulation Of Cryogenic Electronic Circuits Patented View
18938584 Rf Transmit And Receiver Antenna Detector System Patented View
18555965 High Temperature Eca Probe Patented View
18053510 Leakage Test Patented View
18608144 Method And Device For Detecting Subclinical Hypoxemia Using Whole Blood T2p Patented View
18608691 High Performance Inductive Sensing All Digital Phase Locked Loop Patented View
18228332 Eddy Current Flaw Detection System Based On Nv Color Center Quantum Sensing Technology And Detection Method Thereof Patented View
19002737 Experimental Apparatus And Test Method For Pulse Laser Irradiation Wide Bandgap Power Device Patented View
17843837 Pin Testing System For Multi-Pin Chip And Method Thereof Abandoned View
17786374 Steel Plate Surface Material Property Testing Device And Steel Plate Surface Material Property Testing Method Patented View
18432131 Integrated Vector Network Analyzer Patented View
17769791 Test Socket And Method Of Fabricating The Same Patented View
17870512 On-State Voltage Measurement Of High-Side And Low-Side Power Transistors In A Half-Bridge For In-Situ Prognostics Patented View
18113895 Eddy Current Probe And Method For Determining Ply Orientation Using Eddy Current And Ultrasonic Probes Patented View
17820753 Position Independent And Long Read Range Resonant Sensor Patented View
17426498 Improved Metal-Detector Means For Locating The Presence Of Metal Objects Patented View
18102646 Power Detector For Detecting Radio Frequency Power Output Patented View
16995801 Utility Locator Transmitter Devices, Systems, And Methods Patented View
17395805 Scale Abandoned View
18159413 Peak Detector Calibration Patented View
17790873 Eddy Current Sensor For Detecting Crack Of Battery Cell And System For Detecting Crack Of Battery Including The Same Patented View
17681289 Nuclear Magnetic Resonance Coil Array And Decoupling Method Thereof, And Nuclear Magnetic Resonance Detection Device Patented View
17828135 Device And Method For Measuring A Duty Cycle Of A Clock Signal Patented View
17255055 Portable Detection System Comprising Magnetostatic Sensors Patented View
17591374 Vertical Probe Head Abandoned View
18066697 Hall Sensor, Method For Calibrating A Hall Sensor, And Calibration Apparatus For A Hall Sensor Patented View
18316572 Non-Destructive Inspection Method For Pouch-Type Battery Patented View
18915936 Novel Variable Reluctance Resolver Patented View
18172796 Magnetic Sensor, Magnetic Encoder, Lens Position Detection Device, Distance Measuring Device, And Manufacturing Method For Magnetic Sensor Patented View
18349556 Rotary Position Sensing Apparatus And Method Patented View
17786252 Method For Analyzing Electric Signal Of Triboelectric Power Generating Device Abandoned View
17919739 Probe Head And Probe Card Having Same Patented View
18201076 Multi-Input Multi-Zone Thermal Control For Device Testing Patented View

Appeals Statistics

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