Login with your work email address to view charts. No credit card required.
| Art Unit: | 2858 — Electricity: measuring and testing |
|---|---|
| Group: | 2850-2860 — Printing/Measuring and Testing |
| Classes: |
324 — Electricity: measuring and testing 438 — Semiconductor device manufacturing: process 702 — Data processing: measuring, calibrating, or testing 361 — Electricity: electrical systems and devices 244 — Aeronautics and astronautics 600 — Surgery 134 — Cleaning and liquid contact with solids 257 — Active solid-state devices (e.g., transistors, solid-state diodes) |
| Phone: | (571) 270-5818 |
| Email: | son.le@uspto.gov |
| Location: | VA 22314 |
| Title: | Pat Examnr Elctrl Engrg |
| Service: | 15 years |
| Grade: | GS-14 |
| 3-Year Grant rate: | 89% over 333 cases |
|---|---|
| Difficulty: | Easier |
| Difficulty Percentile: | 22nd
|
With Examiner Le, you have a 89% chance of getting an issued patent by 3 years after the first office action. Examiner Le is an easier examiner and in the 22nd percentile across all examiners (with 100th percentile most difficult).
Below is the grant rate timeline for Examiner Le, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.
Examiner Le's grant rate is higher than that of Art Unit 2858 and higher than that of the USPTO.
| Average Office Actions Per Grant | |
|---|---|
| Examiner Le | 1.2 |
| Art Unit 2858 | 1.1 |
Examiner Le has granted 241 of 273 cases without any applicant-requested interviews for a grant rate of 88%.
Examiner Le has granted 55 of 60 cases with at least one applicant-requested interview for a grant rate of 92%.
With Examiner Le, conducting an interview increases your chance of getting a patent granted by 5%.
| Number | Title | OA Rejections | Status | IFW |
|---|---|---|---|---|
| 18370274 | Position Detection For A Rotation Angle Sensor | Rejection information available with a Premium Stats subscription. See our pricing. | Patented | View |
| 18616521 | Broadband Switch For 3t And 7t Magnetic Resonance Imaging | Patented | View | |
| 18693728 | Fail Operational Steering Angle Sensor | Patented | View | |
| 18138006 | Systems, Devices, And Methods For Measuring Direct Current/low Frequency Signal Components | Patented | View | |
| 18472508 | Pulsed Laser Micro Led Inspection | Patented | View | |
| 18577426 | Metal Detector | Abandoned | View | |
| 18020411 | Devices And Methods Directed To Sensing Using Synthetic Materials | Patented | View | |
| 18248520 | A Magnetic Sensing Device | Patented | View | |
| 18441733 | Systems And Methods For Parallel Electrical Endurance Testing Of Contacts | Patented | View | |
| 18558878 | Semiconductor Switch Assembly Having A Monitoring Function, Energy System And Vehicle | Patented | View | |
| 18038638 | 125v Switch Glitch Mitigation | Patented | View | |
| 18542710 | System And Method For Induction Motor Intra-Core Rotor Bar Surface Magnetic Field Analysis | Abandoned | View | |
| 18387580 | Wafer Type Measuring Apparatus And Magnetic Flux Density Measuring Method Using The Same | Patented | View | |
| 18475458 | Magnetic Sensor | Patented | View | |
| 18604369 | Igbt Collector Current Online Detection Device And Method Based On Gate Current | Patented | View | |
| 18553598 | Magnetic Field Measuring Apparatus | Patented | View | |
| 19261530 | Method For Estimating Noise Of Soft Magnetic Core | Patented | View | |
| 18596435 | Test And/or Measurement System | Patented | View | |
| 18280744 | Test Device | Patented | View | |
| 18620487 | Inductive Proximity Sensor For The Detection Of An Object And Method Of Detecting An Object | Patented | View | |
| 18131605 | Cassette Magazine For Thin Wafers | Patented | View | |
| 18072690 | Packaging Device Capable Of Detecting Risk Of Impact Of Electrostatic Charges | Abandoned | View | |
| 18684471 | Load Testing Device | Patented | View | |
| 18491352 | Position Detection Device | Patented | View | |
| 18533269 | Pixel Detection Device And Pixel Detection Method | Patented | View | |
| 18194862 | Impedance Tuner, Magnetic Resonance System, Transmission Apparatus, And Transmission Method | Patented | View | |
| 18464529 | Systems And Methods For Isolating Faults In Die-To-Die Interconnects | Patented | View | |
| 18156646 | Angle Sensor Apparatus And Method | Patented | View | |
| 17507597 | On-Die Power Supply Monitor Design | Patented | View | |
| 18556882 | Switching Circuit Having Constant On-Resistance And Matrix Switch Comprising Same | Patented | View | |
| 18557489 | Sensing Device | Patented | View | |
| 18163056 | Temperature Adjusting Device, Electronic Component Handling Apparatus, And Electronic Component Test Apparatus | Patented | View | |
| 18329389 | Displacement Sensor Arrangement For Determining The Position Of A Body Moving Along A Movement Path In A Vehicle | Patented | View | |
| 18246527 | Dielectric Material For A High Voltage Capacitor | Patented | View | |
| 18188925 | Method And Apparatus With Impedance Measuring | Patented | View | |
| 17287118 | State Analysis Of An Electrical Operating Resource | Patented | View | |
| 18000277 | Omnidirectional Rotational Speed And Rotational Direction Sensor | Patented | View | |
| 18216724 | Pwm Capture Function For Event Analysis | Patented | View | |
| 18133687 | Probe Unit And Holder For A Probe Unit | Patented | View | |
| 18460249 | Device And Method For Testing Crimping Status Of Hardware Fitting And Cable Conductors | Patented | View | |
| 17725877 | Current Sensor | Patented | View | |
| 16944576 | Rotary Angle Detecting Device | Abandoned | View | |
| 17920487 | Photoionization Detector And Method For Gas Sample Analysis | Patented | View | |
| 17043424 | Sensor Arrangement For Capacitive Position Detection Of An Object | Abandoned | View | |
| 17867689 | Testing Method And Manufacturing Method | Patented | View | |
| 18155380 | Method And Device For Adapting Temperatures Of Semiconductor Components | Patented | View | |
| 17923328 | Electrical Sensing Of Gases In Packaged Products And Monitoring Freshness Or Condition Of Perishable Products | Patented | View | |
| 18529262 | Rotational Electrical Probe | Patented | View | |
| 17437233 | Abnormality Diagnosis Device And Abnormality Diagnosis Method | Abandoned | View | |
| 18149322 | Sensor Architecture For Correcting Thermally-Induced Linearity Error | Patented | View |
Subscribe to Premium Examiner Statistics for unlimited access for your law firm.
Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.