Examiner Vazquez Arleen M (SPE)

2857-VAZQUEZ-ARLEEN-M

Employment Information

Art Unit:2857 — Data processing: measuring, calibrating, or testing
Group:2850-2860 — Printing/Measuring and Testing
Classes: 324 — Electricity: measuring and testing
702 — Data processing: measuring, calibrating, or testing
700 — Data processing: generic control systems or specific applications
Phone:(571) 272-2619
Email:arleen.vazquez@uspto.gov
Location:VA 22314
Title:Supvy Pat Examnr Elctrl Engrg
Service:21 years
Grade:GS-15

Grant Rate and Difficulty Ranking

3-Year Grant rate: 0% over 4 cases
Difficulty: Not enough data to rank
Difficulty Percentile:

With Examiner Vazquez (SPE), you have a 0% chance of getting an issued patent by 3 years after the first office action.

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Vazquez (SPE), where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2857

Examiner Vazquez (SPE)'s grant rate is lower than that of Art Unit 2857 and lower than that of the USPTO.

Average Office Actions Per Grant
Examiner Vazquez (SPE) 0.3
Art Unit 2857 1.5

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Appeals Statistics

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Appeal History

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Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
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