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| Art Unit: | 2857 — Data processing: measuring, calibrating, or testing |
|---|---|
| Group: | 2850-2860 — Printing/Measuring and Testing |
| Classes: |
702 — Data processing: measuring, calibrating, or testing 706 — Data processing: artificial intelligence 703 — Data processing: structural design, modeling, simulation, and emulation 718 — Electrical computers and digital processing systems: virtual machine task or process management or task management/control 715 — Data processing: presentation processing of document, operator interface processing, and screen saver display processing 177 — Weighing scales 700 — Data processing: generic control systems or specific applications 705 — Data processing: financial, business practice, management, or cost/price determination 342 — Communications: directive radio wave systems and devices (e.g., radar, radio navigation) 713 — Electrical computers and digital processing systems: support |
| Phone: | (571) 272-2275 |
| Email: | john.le@uspto.gov |
| Location: | VA 22314 |
| Title: | Pat Examnr Computer Science |
| Service: | 26 years |
| Grade: | GS-14 |
| 3-Year Grant rate: | 92% over 459 cases |
|---|---|
| Difficulty: | Very Easy |
| Difficulty Percentile: | 13th
|
With Examiner Le, you have a 92% chance of getting an issued patent by 3 years after the first office action. Examiner Le is a very easy examiner and in the 13th percentile across all examiners (with 100th percentile most difficult).
Below is the grant rate timeline for Examiner Le, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.
Examiner Le's grant rate is higher than that of Art Unit 2857 and higher than that of the USPTO.
| Average Office Actions Per Grant | |
|---|---|
| Examiner Le | 1.2 |
| Art Unit 2857 | 1.5 |
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Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.