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| Art Unit: | 2851 — Computer-aided design and analysis of circuits and semiconductor masks |
|---|---|
| Group: | 28XX — Semiconductors B |
| Classes: |
716 — Computer-aided design and analysis of circuits and semiconductor masks 320 — Electricity: battery or capacitor charging or discharging 706 — Data processing: artificial intelligence |
| Phone: | (703) 756-1018 |
| Email: | None |
| Location: | None |
| Title: | Pat Examnr Compr Engrg |
| Service: | 2 years |
| Grade: | GS-07 |
Below is the grant rate timeline for Examiner Alawdi, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.
Examiner Alawdi's grant rate is lower than that of Art Unit 2851 and lower than that of the USPTO.
| Average Office Actions Per Grant | |
|---|---|
| Examiner Alawdi | 1.0 |
| Art Unit 2851 | 1.0 |
Examiner Alawdi has granted 0 of 0 cases without any applicant-requested interviews for a grant rate of 0%.
Examiner Alawdi has granted 0 of 0 cases with at least one applicant-requested interview for a grant rate of 0%.
With Examiner Alawdi, conducting an interview increases your chance of getting a patent granted by 100%.
| Number | Title | OA Rejections | Status | IFW |
|---|---|---|---|---|
| 17572597 | Systems And Methods For Modeling Via Defect | Rejection information available with a Premium Stats subscription. See our pricing. | Patented | View |
| 17551450 | Method For Setting Of Semiconductor Manufacturing Parameter And Computing Device For Executing The Method | Patented | View | |
| 17569479 | Method And Apparatus For Locating And Identifying Physical Blocks Within A Grid | Abandoned | View |
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