1. Stats
  2. USPTO
  3. TC 2800
  4. Group 28XX
  5. Art Unit 2893
  6. Examiner Sengdara

Examiner Sengdara Vongsavanh

2893-SENGDARA-VONGSAVANH

Employment Information

Art Unit:2893 — Active solid-state devices (e.g., transistors, solid-state diodes)
Group:28XX — Semiconductors B
Classes: 257 — Active solid-state devices (e.g., transistors, solid-state diodes)
438 — Semiconductor device manufacturing: process
702 — Data processing: measuring, calibrating, or testing
700 — Data processing: generic control systems or specific applications
706 — Data processing: artificial intelligence
361 — Electricity: electrical systems and devices
327 — Miscellaneous active electrical nonlinear devices, circuits, and systems
713 — Electrical computers and digital processing systems: support
463 — Amusement devices: games
Phone:(571) 270-5770
Email:vongsavanh.sengdara@uspto.gov
Location:VA 22314
Title:Pat Examnr Elctrl Engrg
Service:18 years
Grade:GS-14

Grant Rate and Difficulty Ranking

57
3-Year Grant rate: 73% over 348 cases
Difficulty: Medium
Difficulty Percentile: 57th

With Examiner Sengdara, you have a 73% chance of getting an issued patent by 3 years after the first office action. Examiner Sengdara is a medium examiner and in the 57th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Sengdara, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2893

Examiner Sengdara's grant rate is lower than that of Art Unit 2893 and lower than that of the USPTO.

Average Office Actions Per Grant
Examiner Sengdara 2.4
Art Unit 2893 1.3

Interview Benefit

Grant Rate without Interview

Examiner Sengdara has granted 178 of 228 cases without any applicant-requested interviews for a grant rate of 78%.

Grant Rate with Interview

Examiner Sengdara has granted 76 of 120 cases with at least one applicant-requested interview for a grant rate of 63%.

Interview Benefit

With Examiner Sengdara, conducting an interview decreases your chance of getting a patent granted by 19%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
18623285 Gate-All-Around Device With Protective Dielectric Layer And Method Of Forming The Same Rejection information available with a Premium Stats subscription. See our pricing. Patented View
18300867 Integrated Circuit Device Patented View
17793569 Nonvolatile Memory Element And Method For Manufacturing The Same Patented View
18362057 Backside Power Via Patented View
17853386 Contact Structure Manufacturing Method Patented View
17690406 Display Panel Patented View
17352403 Flexible Display Device Abandoned View
18029380 Display Substrate And Display Apparatus Patented View
17845093 Methods Of Producing Single Photon Emitters On Substrates, And Devices, And Chips Patented View
17859284 Semiconductor Device Patented View
18298382 Display Device Manufacturing Method Patented View
17771659 Display Substrate And Display Apparatus Patented View
18016680 Display Panel And Display Apparatus Patented View
18299082 Display Device And Manufacturing Method Of Display Device Patented View
17875462 Memory Device With Improved Data Retention Patented View
18015125 Display Panel And Fabricating Method Thereof, Light Emitting Apparatus And Displaying Device Patented View
17302689 Integrated Circuit Metal Gate Structure And Method Of Fabricating Thereof Patented View
17758133 Display Panel And Display Device Patented View
18156410 Display Device Patented View
17779327 Thin Film Transistor And Manufacturing Method Therefor, And Display Apparatus Patented View
17323631 Display Apparatus Patented View
18151677 Memory Cell Of Charge-Trapping Non-Volatile Memory Patented View
18358013 Display Panel And Method Of Manufacturing The Same Abandoned View
18467208 Diamond Semiconductor System And Method Abandoned View
17014651 Organic Light-Emitting Diode Display Abandoned View
17371016 Display Device Patented View
18202254 Display Device Patented View
17755042 Display Panel And Manufacturing Method Thereof Patented View
17899508 Display Apparatus Patented View
18543864 Display Apparatus Having Substrate Hole Patented View
17940519 Semiconductor Device Patented View
17385711 Dielectric Constant Reduction Of Gate Spacer Patented View
17497490 Display Device Patented View
17796241 Display Device Patented View
17785076 Display Panel And Display Device Patented View
17746893 Display Device And Method For Manufacturing The Same Patented View
17242779 Display Panel And Display Device Including The Same Patented View
18643839 Display Device Patented View
17127566 Display Device Abandoned View
18383051 Display Device Patented View
17660060 Semiconductor Structure And Forming Method Thereof Patented View
17845301 Thin-Film Transistor Substrate, Manufacturing Method Thereof, And Display Apparatus Employing The Thin-Film Transistor Substrate Patented View
17486649 Methods For Forming Structures With Desired Crystallinity For Mram Applications Patented View
17333936 Display Panel And Display Device Patented View
17565925 Display Apparatus And Method Of Manufacturing The Same Patented View
18062495 Methods Of Forming Nanostructures Including Metal Oxides Using Block Copolymer Materials Patented View
18225324 Display Device Patented View
17747501 Group 13 Element Nitride Crystal Layer, Self-Supporting Substrate, And Functional Element Patented View
17891173 Array Substrate And Display Device Patented View
17875706 Electroluminescent Display Device Patented View

Appeals Statistics

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