Examiner Hoque Mohammad M

2817-HOQUE-MOHAMMAD-M

Employment Information

Art Unit:2817 — Active solid-state devices (e.g., transistors, solid-state diodes)
Group:2810-2820 — Semiconductors A/Memory
Classes: 257 — Active solid-state devices (e.g., transistors, solid-state diodes)
438 — Semiconductor device manufacturing: process
382 — Image analysis
327 — Miscellaneous active electrical nonlinear devices, circuits, and systems
Phone:(571) 272-6266
Email:mohammad.hoque@uspto.gov
Location:VA 22314
Title:Pat Examnr Elctrl Engrg
Service:13 years
Grade:GS-14

Grant Rate and Difficulty Ranking

34
3-Year Grant rate: 85% over 396 cases
Difficulty: Easier
Difficulty Percentile: 34th

With Examiner Hoque, you have a 85% chance of getting an issued patent by 3 years after the first office action. Examiner Hoque is an easier examiner and in the 34th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Hoque, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2817

Examiner Hoque's grant rate is lower than that of Art Unit 2817 and higher than that of the USPTO.

Average Office Actions Per Grant
Examiner Hoque 1.4
Art Unit 2817 1.2

Interview Benefit

Grant Rate without Interview

Examiner Hoque has granted 268 of 322 cases without any applicant-requested interviews for a grant rate of 83%.

Grant Rate with Interview

Examiner Hoque has granted 67 of 74 cases with at least one applicant-requested interview for a grant rate of 91%.

Interview Benefit

With Examiner Hoque, conducting an interview increases your chance of getting a patent granted by 10%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
18107377 Semiconductor Switching Device Rejection information available with a Premium Stats subscription. See our pricing. Patented View
17939025 Insulated Gate Bipolar Transistor (Igbt) Semiconductor Device With Reduced Turn-On Loss Patented View
18053744 Image Sensor Including A Buried Gate Patented View
18073388 Trench Gate Type Igbt Patented View
17892177 Semiconductor Device Having An Edge Termination Structure And Manufacturing Method Thereof Patented View
18016767 Semiconductor Device Including First P-Type Body Region Contact Region Patented View
17878825 Integrated Circuit Cell With Dual Row, Back-To-Back, Transistor Body Ties Patented View
18402852 Method For Manufacturing Semiconductor Device Patented View
18034582 Display Device And Electronic Equipment Patented View
18461679 Field-Effect Transistor And Method For Manufacturing Same Patented View
17886578 An Image Sensor In Which Pixels Have Substantially Uniform Heights And A Method Of Fabricating The Same Patented View
17658697 Gate Profile Control Through Sidewall Protection During Etching Patented View
17771973 Display Substrate, Display Substrate Motherboard And Manufacturing Method Therefor, And Display Device Patented View
17757516 Semiconductor Element For Inspection Of Wires Abandoned View
18022499 Reverse-Conducting Igbt Chip Patented View
17807011 Vertical Field Effect Transistor With Strained Channel Abandoned View
16858293 Semiconductor Structure Having Different Heights Of Active Regions Patented View
17683589 Semiconductor Device And Method Of Fabricating The Same Patented View
17800248 Display Panel Including Power Connection Lines And Display Device Patented View
18173262 Semiconductor Device With Pillar- Shaped Shielded Gate Structures Abandoned View
18230750 Vertical Transistors And Methods For Forming The Same Patented View
17780701 Display Substrates For Full-Screen Display And Methods Of Manufacturing Display Substrate, Display Panels, Display Devices Patented View
17915921 Display Panel And Display Device Patented View
18146629 Superjunction Semiconductor Device And Method Of Manufacturing Same Patented View
17889945 Semiconductor Device Having Control Electrodes In Termination Region Patented View
18255425 Semiconductor Device Patented View
17565484 Smeiconductor Memory Device Having Asymmetric Active Area Layout Structure Patented View
18742009 Semiconductor Device With Biofet And Biometric Sensors Patented View
17661548 Equalization Circuit Structure And Manufacturing Method Thereof, Sense Amplification Circuit Structure And Memory Circuit Structure Patented View
17869586 Methods Used In Forming Memory Arrays Having Strings Of Memory Cells Patented View
17461186 Dry Etching Of Semiconductor Structures With Fluorine-Containing Gases Patented View
17936106 Integrated Circuit Devices Including Backside Power Rail And Methods Of Forming The Same Patented View
17612321 Method For Manufacturing Electronic Component Device And Electronic Component Device Patented View
17725015 Semiconductor Device Including First And Second Transistor Channels Patented View
18750424 Hybrid High-K Dielectric Material Film Stacks Comprising Zirconium Oxide Utilized In Display Devices Abandoned View
18389105 Electronic Structure Patented View
17951494 Method For Forming Semiconductor Device That Includes Flash Memory Patented View
17823799 Vtfet With Controlled Fin Height Patented View
17903644 Local Enlarged Via-To-Backside Power Rail Patented View
17884090 Ultra-Shallow Dopant And Ohmic Contact Regions By Solid State Diffusion Patented View
17298032 Display Substrate And Manufacturing Method Therefor, And Display Device Patented View
17933142 Semiconductor Memory Device With Nanowire Structure And Forming Method Thereof Patented View
17581557 Switching Cell With Direct Contact To Fixed Resistor Element Patented View
17936202 Vertical-Transport Field-Effect Transistor With Backside Gate Contact Patented View
17697400 Vertical Channel Transistor Including A Graphene Insertion Layer Beweeen A Source/drain Electrode And A Channel Pattern Patented View
18758926 Fin Field-Effect Transistor And Method Of Forming The Same Patented View
17669080 Insulated Gate Bipolar Field-Effect Transistor, Group, And Power Converter Abandoned View
17494061 Bottom Air Spacer By Oxidation Abandoned View
17487001 Semicondictor Apparatus With Different Emitter Region Densities Patented View
17234641 Semiconductor Device With Biofet And Biometric Sensors Patented View

Appeals Statistics

Purchase Subscription

Subscribe to Premium Examiner Statistics for unlimited access for your law firm.

Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.

Loading...