| Examiner | Number of Cases | 3YGR |
|---|---|---|
| Examiner Albrecht | 279 | 63% |
| Examiner Beardsley | 166 | 52% |
| Examiner Chou | 348 | 70% |
| Examiner Enad | 630 | 92% |
| Examiner Gebremariam | 370 | 93% |
| Examiner Gurley (SPE) | 15 | 0% |
| Examiner Kim | 806 | 98% |
| Examiner Li | 324 | 64% |
| Examiner Nadav | 271 | 49% |
| Examiner Tran | 280 | 85% |
| Examiner Yasmeen | 247 | 71% |
| Examiner Yushina | 485 | 89% |
| Art Unit 2811 | 4221 | 81% |
| Number | Class Description |
|---|---|
| 257 | Active solid-state devices (e.g., transistors, solid-state diodes) |
| 438 | Semiconductor device manufacturing: process |
| 702 | Data processing: measuring, calibrating, or testing |
| 310 | Electrical generator or motor structure |
| 100 | Presses |
| 703 | Data processing: structural design, modeling, simulation, and emulation |
| 451 | Abrading |
| 365 | Static information storage and retrieval |
| 359 | Optical: systems and elements |
| 623 | Prosthesis (i.e., artificial body members), parts thereof, or aids and accessories therefor |
Art Unit 2811's grant rate is lower than that of Group 2810-2820 and higher than that of the USPTO.
Below is the grant rate timeline for Art Unit 2811, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.
Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.