1. Stats
  2. USPTO
  3. TC 2800
  4. Group 2810-2820
  5. Art Unit 2811
  6. Examiner Li

Examiner Li Meiya

2811-LI-MEIYA

Employment Information

Art Unit:2811 — Active solid-state devices (e.g., transistors, solid-state diodes)
Group:2810-2820 — Semiconductors A/Memory
Classes: 257 — Active solid-state devices (e.g., transistors, solid-state diodes)
438 — Semiconductor device manufacturing: process
313 — Electric lamp and discharge devices
349 — Liquid crystal cells, elements and systems
365 — Static information storage and retrieval
Phone:(571) 270-1572
Email:meiya.li@uspto.gov
Location:VA 22314
Title:Pat Examnr Elctrl Engrg
Service:20 years
Grade:GS-14

Grant Rate and Difficulty Ranking

70
3-Year Grant rate: 62% over 293 cases
Difficulty: Harder
Difficulty Percentile: 70th

With Examiner Li, you have a 62% chance of getting an issued patent by 3 years after the first office action. Examiner Li is a harder examiner and in the 70th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Li, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2811

Examiner Li's grant rate is lower than that of Art Unit 2811 and lower than that of the USPTO.

Average Office Actions Per Grant
Examiner Li 2.0
Art Unit 2811 1.6

Interview Benefit

Grant Rate without Interview

Examiner Li has granted 122 of 202 cases without any applicant-requested interviews for a grant rate of 60%.

Grant Rate with Interview

Examiner Li has granted 60 of 91 cases with at least one applicant-requested interview for a grant rate of 66%.

Interview Benefit

With Examiner Li, conducting an interview increases your chance of getting a patent granted by 10%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
17767430 Nitride-Based Semiconductor Device And Method For Operating The Same Rejection information available with a Premium Stats subscription. See our pricing. Abandoned View
17747412 Semiconductor Device And Electronic System Including The Same Patented View
17726965 Depositing A Storage Node Patented View
17781737 Silicon Carbide Semiconductor Device And Method For Manufacturing Silicon Carbide Semiconductor Device Abandoned View
17465588 Semiconductor Device And Method For Fabricating The Same Abandoned View
18357332 Memory Device Patented View
17724901 Semiconductor Devices Patented View
17409069 Semiconductor Devices And Methods Of Fabricating The Same Patented View
16811365 Display Device And Method Of Manufacturing The Same Patented View
17194629 Semiconductor Memory Device Abandoned View
17178257 Semiconductor Chip Patented View
18202237 Memory Devices And Methods Of Forming Memory Devices Patented View
17661355 Semiconductor Structure And Manufacturing Method Thereof, Data Storage Device And Data Read-Write Device Abandoned View
18301113 Memory Array Isolation Structures Patented View
17220531 Display Device Patented View
17211723 Pixel Of A Light Sensor And Method Of Manufacturing Patented View
17225859 Semiconductor Device Structure Including Forksheet Transistors And Methods Of Forming The Same Patented View
15442962 Optical Device And Method For Its Fabrication Abandoned View
17186077 Quantum Dots And Devices Including The Same Patented View
17455212 Semiconductor Device And Manufacturing Method Thereof Abandoned View
17310282 Memory Abandoned View
18348572 Read-Only Memory For Chip Security That Is Mosfet Process Compatible Patented View
17531864 Mask-Programmable Read Only Memory With Electrically Isolated Cells Patented View
17735838 Semiconductor Memory Device And Method Of Fabricating The Same Patented View
17216264 Memory Device Including Control Gates Having Tungsten Structure Patented View
18354768 Integrated Circuit And Method For Manufacturing The Same Patented View
17543997 Method For Forming Storage Node Contact Structure And Semiconductor Structure Patented View
17827808 Semiconductor Structure And Fabrication Method Thereof Abandoned View
17722409 Photosensitive Device Patented View
17888525 Semiconductor Device And Method Of Fabricating The Same Patented View
17825058 Semiconductor Device With Programable Feature Patented View
17432678 Solid-State Imaging Device And Electronic Equipment Patented View
16357338 Semiconductor Device And Method Of Manufacturing Semiconductor Device Abandoned View
17584141 Display Apparatus Patented View
17880954 Methods For Forming Image Sensors Patented View
18221535 Method For Preparing Memory Array With Contact Enhancement Cap Patented View
17595610 Method Of Fabricating Memory Abandoned View
16221868 Multilayer Structure For Reducing Film Roughness In Magnetic Devices Patented View
17804095 Memory Structure And Method Of Manufacturing The Same Patented View
18336252 Protective Liner Layers In 3d Memory Structure Patented View
17830620 Semiconductor Device And Method For Manufacturing The Same Patented View
17500977 Semiconductor Device And Method Of Fabricating The Same Abandoned View
18194886 Semiconductor Device Patented View
17308285 Light Emitting Base Plate And Fabricating Method Thereof, And Displaying Device Patented View
17555693 Method Of Manufacturing Display Module With Light Emitting Diode Free Of A Split-Screen Boundary Line And Display Module With Light Emitting Diode Patented View
17240131 Image Sensor Package And Method Of Fabricating The Same Patented View
18330604 Memory Array Channel Regions Patented View
17573593 Package Process And Package Structure Patented View
17467157 Display Device And Method Of Manufacturing The Same Patented View
18057225 Method For Forming Semiconductor Memory Structure Patented View

Appeals Statistics

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