1. Stats
  2. USPTO
  3. TC 2800
  4. Group 2810-2820
  5. Art Unit 2811
  6. Examiner Enad

Examiner Enad Christine A

2811-ENAD-CHRISTINE-A

Employment Information

Art Unit:2811 — Active solid-state devices (e.g., transistors, solid-state diodes)
Group:2810-2820 — Semiconductors A/Memory
Classes: 257 — Active solid-state devices (e.g., transistors, solid-state diodes)
438 — Semiconductor device manufacturing: process
702 — Data processing: measuring, calibrating, or testing
703 — Data processing: structural design, modeling, simulation, and emulation
623 — Prosthesis (i.e., artificial body members), parts thereof, or aids and accessories therefor
310 — Electrical generator or motor structure
136 — Batteries: thermoelectric and photoelectric
451 — Abrading
700 — Data processing: generic control systems or specific applications
Phone:(571) 270-7891
Email:christine.enad@uspto.gov
Location:VA 22314
Title:Pat Examnr Computer Science
Service:18 years
Grade:GS-14

Grant Rate and Difficulty Ranking

14
3-Year Grant rate: 92% over 585 cases
Difficulty: Very Easy
Difficulty Percentile: 14th

With Examiner Enad, you have a 92% chance of getting an issued patent by 3 years after the first office action. Examiner Enad is a very easy examiner and in the 14th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Enad, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2811

Examiner Enad's grant rate is higher than that of Art Unit 2811 and higher than that of the USPTO.

Average Office Actions Per Grant
Examiner Enad 1.6
Art Unit 2811 1.6

Interview Benefit

Grant Rate without Interview

Examiner Enad has granted 394 of 432 cases without any applicant-requested interviews for a grant rate of 91%.

Grant Rate with Interview

Examiner Enad has granted 144 of 153 cases with at least one applicant-requested interview for a grant rate of 94%.

Interview Benefit

With Examiner Enad, conducting an interview increases your chance of getting a patent granted by 3%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
18225028 Method Of Forming Multiple-Vt Fets For Cmos Circuit Applications Rejection information available with a Premium Stats subscription. See our pricing. Patented View
18104480 Semiconductor Devices And Methods Of Fabrication Thereof Patented View
18650026 Semiconductor Device And Forming Method Thereof Patented View
18448188 Semiconductor Structure And Method Of Manufacturing The Same Patented View
17842169 Method For Removing Edge Of Substrate In Semiconductor Structure Patented View
17934400 Transistor Devices With Double-Side Contacts Patented View
18195150 3d-Stacked Transistor Structure With Barrier Layer Between Upper Gate Structure And Lower Gate Structure Patented View
17711854 Junction Field Effect Transistors For Low Voltage And Low Temperature Operation Patented View
18325412 Semiconductor Devices Patented View
17863741 Methods Of Manufacturing Semiconductor Devices Patented View
17648010 Epitaxy Regions With Reduced Loss Control Patented View
17892864 Semiconductor Device With Reverse-Cut Source/drain Contact Structure And Method Thereof Patented View
18347813 Self-Aligned Patterning Layer For Metal Gate Formation Patented View
18040505 Light-Emitting Substrate, Method For Manufacturing The Same, And Display Device Patented View
18049036 Semiconductor Device And Method Of Fabricating The Same Patented View
17566402 Optimizing Stress In A Hybrid Vertical-Pfet And Horizontal-Nfet Nanosheet Structure Patented View
17950434 Three-Dimensional Semiconductor Device And Method Of Fabricating The Same Patented View
18519714 Semiconductor Device Contact Structures And Methods Of Fabricating Thereof Patented View
17577996 Semiconductor Memory Device And Method For Manufacturing The Same Patented View
18786372 3d Semiconductor Device And Structure With Logic Circuits, Memory Cells, And Processor Array Patented View
18098465 Light Emitting Display Device Patented View
18677372 Isolation Structures For Semiconductor Devices Patented View
18654766 Semiconductor Device And Method Patented View
17676470 Dummy Fin Structures And Methods Of Forming Same Patented View
17623639 Lamination Wafers And Method Of Producing Bonded Wafers Using The Same Patented View
17946546 Stacked Fets With Contact Placeholder Structures Patented View
17989944 Semiconductor Device Patented View
18400951 High-K Gate Dielectric Patented View
17690595 Method And Structure For Metal Tracks In Semiconductor Devices Patented View
17799272 Nitride Semiconductor Device, And Method Of Manufacturing Nitride Semiconductor Device Patented View
17644528 Cross Bar Vertical Fets Patented View
18595069 Lighting Emitting Stacked Structure And Display Device Having The Same Patented View
17674231 Built-In Component Board, Method Of Manufacturing The Built-In Component Board Patented View
18655832 Finfet Device And Method Patented View
18232272 Core-Shell Nanostructures For Semiconductor Devices Patented View
17630906 Display Device, Display Panel And Manufacturing Method Thereof, Driving Circuit And Driving Method Patented View
17675809 High Dielectric Constant Metal Gate Mos Transistor And Method For Making The Same Abandoned View
18739519 Gate Structures For Semiconductor Devices Patented View
17709374 Integrated Circuit Structures Having Backside Gate Tie-Down Patented View
18357796 Metal Gate Stacks And Methods Of Fabricating The Same In Multi-Gate Field-Effect Transistors Patented View
18366871 Gate Structure And Method Of Forming Same Patented View
18090721 Semiconductor Device With Work Function Layer Patented View
18737616 Integrated Circuit Structures Including A Titanium Silicide Material Patented View
18408438 Method Of Manufacturing Semiconductor Devices And Semiconductor Devices Patented View
18634782 Integrated Circuit With Backside Power Rail And Backside Interconnect Patented View
17965927 Semiconductor Device Patented View
18736589 Semiconductor Structure Patented View
18670123 Semiconductor Device Having Fins And Method Of Fabricating The Same Patented View
17892415 Semiconductor Device Patented View
18594073 Low Resistance Fill Metal Layer Material As Stressor In Metal Gates Patented View

Appeals Statistics

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