Examiner Liew Alex Kok S

2674-LIEW-ALEX-KOK-S

Employment Information

Art Unit:2674 — Facsimile and static presentation processing
Group:2660-2670 — Image Analysis; Applications; pattern Recognition; Color and Compression; Enhancement and Transformation
Classes: 382 — Image analysis
705 — Data processing: financial, business practice, management, or cost/price determination
706 — Data processing: artificial intelligence
345 — Computer graphics processing and selective visual display systems
348 — Television
700 — Data processing: generic control systems or specific applications
707 — Data processing: database and file management or data structures
600 — Surgery
702 — Data processing: measuring, calibrating, or testing
434 — Education and demonstration
Phone:(571) 272-8623
Email:alexa.liew@uspto.gov
Location:VA 22314
Title:Pat Examnr Elctrl Engrg
Service:21 years
Grade:GS-14

Grant Rate and Difficulty Ranking

14
3-Year Grant rate: 92% over 497 cases
Difficulty: Very Easy
Difficulty Percentile: 14th

With Examiner Liew, you have a 92% chance of getting an issued patent by 3 years after the first office action. Examiner Liew is a very easy examiner and in the 14th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Liew, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2674

Examiner Liew's grant rate is higher than that of Art Unit 2674 and higher than that of the USPTO.

Average Office Actions Per Grant
Examiner Liew 1.0
Art Unit 2674 1.3

Interview Benefit

Grant Rate without Interview

Examiner Liew has granted 378 of 416 cases without any applicant-requested interviews for a grant rate of 91%.

Grant Rate with Interview

Examiner Liew has granted 78 of 81 cases with at least one applicant-requested interview for a grant rate of 96%.

Interview Benefit

With Examiner Liew, conducting an interview increases your chance of getting a patent granted by 5%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
18423609 Anterior Segment Analysis Apparatus, Anterior Segment Analysis Method, And Non-Transitory Computer-Readable Storage Medium Rejection information available with a Premium Stats subscription. See our pricing. Patented View
18531192 Obtaining A Depth Map Patented View
18279353 Inspection Device, Inspection Method, And Recording Medium Patented View
17888796 Systems And Methods For Air Cargo Container Damage Monitoring Abandoned View
18076663 Diagnosis Support System, Diagnosis Support Method, And Storage Medium Patented View
18323233 Increasing Resolution Of Digital Images Using Self-Supervised Burst Super-Resolution Patented View
18460306 Systems And Methods For Mapping Based On Multi-Journey Data Patented View
18538619 Tone Mapping For Spherical Images Patented View
18310216 Method Of Detecting Object In Video And Video Analysis Terminal Patented View
18399163 Image Registration Method And System Patented View
18265468 Information Processing Apparatus, Information Processing Method, Storage Medium Patented View
18288552 A Weakly Supervised Semantic Segmentation Method And Device Based On A Commonality-Specificity Supervision Mechanism Patented View
18491059 System And Method For Detecting, Reading And Matching In A Retail Scene Patented View
18272290 Soft Anchor Point Object Detection Abandoned View
18230765 Semantic Segmentation Method And System Patented View
17701551 Data Rate Control For Image Transmission Patented View
17966193 Fraudulent Activity Detection At A Barcode Scanner By Verifying Visual Signatures Patented View
18553885 Mark Hole Positioning Method And Apparatus, Assembly Device, And Storage Medium Patented View
18198165 Image Classification Method And Apparatus, Computer Device, And Storage Medium Patented View
18678894 Systems And Methods For Generating Encoded Representations For Multiple Magnifications Of Image Data Patented View
18476622 System And Method With Diffusion-Based Outlier Synthesis For Anomaly Detection Patented View
18360105 System And Method Of Liveness Detection With Preservation Of Original Image Characteristics Patented View
18342067 Apparatus And Method For Identifying Insect Objects Through Learning Patented View
17831139 Simplifying Convolutional Neural Networks Using Logical Representations Of Images Patented View
18355980 Information Processing Apparatus, Information Processing System, Information Processing Method, And Non-Transitory Computer Readable Medium Patented View
18365060 Single-Stage Open-Vocabulary Panoptic Segmentation Patented View
18052728 Method, Computer Software, Non-Transitory Storage Medium, Apparatus And System For Performing A Measurement Of A Physiological Parameter Of A Person From A Series Of Images Patented View
17675898 Aligning Data For Mapping Patented View
18449191 Generation Of Semantically Modified Variations Of Images With Transformer Networks Patented View
18462487 Fiber Tracking And Segmentation Patented View
18275273 Device And Method For Correspondence Analysis In Images Patented View
17692063 Glare Mitigation Techniques In Symbologies Patented View
17752506 Lesion Detection And Segmentation Patented View
17453953 Artificial Intelligence Prediction Of Prostate Cancer Outcomes Patented View
19044329 Means For Using Microstructure Of Materials Surface As A Unique Identifier Patented View
18125675 Method For Training An Image Depth Recognition Model, Method For Recognizing Image Depth, And Electronic Device Patented View
18328306 System And Method For Computer Inspection Of Surface-Mount Devices Patented View
18114081 Spectral Unmixing Of Fluorescence Imaging Using Radiofrequency-Multiplexed Excitation Data Patented View
18135880 Image Clustering Method And Apparatus, Computer Device, And Storage Medium Patented View
18134625 Method For Labeling Image Object And Circuit System Patented View
18216852 Filtering False Positive Computer-Vision-Based Object Detection Events Patented View
18095849 Tool System Abandoned View
17777501 Storage Area Loading Status Measurement Systems And Methods Patented View
17437238 Noise Tolerant Ensemble Rcnn For Semi-Supervised Object Detection Patented View
17911724 Recommendation Device, System, Method, And Non-Transitory Computer-Readable Medium Storing Program Patented View
17784603 Image Analysis Method, Image Generation Method, Learning-Model Generation Method, Annotation Apparatus, And Annotation Program Abandoned View
18429536 Demosaicing Circuit For Demosaicing Quad Bayer Raw Image Data Patented View
18942327 Dynamic Data Collection And Systematic Processing System Patented View
18121674 System For Counting Objects In An Ultra-Wide Scene Patented View
18741370 Method And Apparatus For Data Structuring Of Text Patented View

Appeals Statistics

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