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| Art Unit: | 2181 — Electrical computers and digital data processing systems: input/output |
|---|---|
| Group: | 2180 — Computer Architecture, I/O, Modeling and Simulation |
| Classes: |
710 — Electrical computers and digital data processing systems: input/output 712 — Electrical computers and digital processing systems: processing architectures and instruction processing (e.g., processors) 706 — Data processing: artificial intelligence 711 — Electrical computers and digital processing systems: memory 705 — Data processing: financial, business practice, management, or cost/price determination 718 — Electrical computers and digital processing systems: virtual machine task or process management or task management/control 439 — Electrical connectors 323 — Electricity: power supply or regulation systems 700 — Data processing: generic control systems or specific applications 701 — Data processing: vehicles, navigation, and relative location |
| Phone: | (571) 272-0671 |
| Email: | chunkuan.lee@uspto.gov |
| Location: | VA 22314 |
| Title: | Pat Examnr Elctrl Engrg |
| Service: | 21 years |
| Grade: | GS-14 |
| 3-Year Grant rate: | 69% over 218 cases |
|---|---|
| Difficulty: | Harder |
| Difficulty Percentile: | 62nd
|
With Examiner Lee, you have a 69% chance of getting an issued patent by 3 years after the first office action. Examiner Lee is a harder examiner and in the 62nd percentile across all examiners (with 100th percentile most difficult).
Below is the grant rate timeline for Examiner Lee, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.
Examiner Lee's grant rate is lower than that of Art Unit 2181 and lower than that of the USPTO.
| Average Office Actions Per Grant | |
|---|---|
| Examiner Lee | 2.0 |
| Art Unit 2181 | 1.3 |
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Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.