Examiner Leroux Etienne P

2161-LEROUX-ETIENNE-P

Employment Information

Art Unit:2161 — Data processing: database and file management or data structures
Group:2150-2160 — Data Bases & File Management
Classes: 707 — Data processing: database and file management or data structures
706 — Data processing: artificial intelligence
705 — Data processing: financial, business practice, management, or cost/price determination
702 — Data processing: measuring, calibrating, or testing
386 — Motion video signal processing for recording or reproducing
714 — Error detection/correction and fault detection/recovery
434 — Education and demonstration
713 — Electrical computers and digital processing systems: support
341 — Coded data generation or conversion
726 — Information security
Phone:(571) 272-4022
Email:etienne.leroux@uspto.gov
Location:VA 22314
Title:Pat Examnr Elctrl Engrg
Service:27 years
Grade:GS-14

Grant Rate and Difficulty Ranking

10
3-Year Grant rate: 93% over 352 cases
Difficulty: Extremely Easy
Difficulty Percentile: 10th

With Examiner Leroux, you have a 93% chance of getting an issued patent by 3 years after the first office action. Examiner Leroux is an extremely easy examiner and in the 10th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Leroux, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2161

Examiner Leroux's grant rate is higher than that of Art Unit 2161 and higher than that of the USPTO.

Average Office Actions Per Grant
Examiner Leroux 1.0
Art Unit 2161 1.4

Interview Benefit

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Recent Dispositions

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Appeals Statistics

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Appeal History

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Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.

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