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| Art Unit: | 2116 — Data processing: generic control systems or specific applications |
|---|---|
| Group: | 2110 — Computer Error Control, Reliability, & Control Systems |
| Classes: |
700 — Data processing: generic control systems or specific applications 702 — Data processing: measuring, calibrating, or testing 705 — Data processing: financial, business practice, management, or cost/price determination 717 — Data processing: software development, installation, and management 715 — Data processing: presentation processing of document, operator interface processing, and screen saver display processing 707 — Data processing: database and file management or data structures 175 — Boring or penetrating the earth 703 — Data processing: structural design, modeling, simulation, and emulation 241 — Solid material comminution or disintegration 706 — Data processing: artificial intelligence |
| Phone: | (571) 270-5069 |
| Email: | michael.choi@uspto.gov |
| Location: | VA 22314 |
| Title: | Pat Examnr Elctrl Engrg |
| Service: | 10 years |
| Grade: | GS-14 |
| 3-Year Grant rate: | 80% over 228 cases |
|---|---|
| Difficulty: | Medium |
| Difficulty Percentile: | 44th
|
With Examiner Choi, you have a 80% chance of getting an issued patent by 3 years after the first office action. Examiner Choi is a medium examiner and in the 44th percentile across all examiners (with 100th percentile most difficult).
Below is the grant rate timeline for Examiner Choi, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.
Examiner Choi's grant rate is lower than that of Art Unit 2116 and higher than that of the USPTO.
| Average Office Actions Per Grant | |
|---|---|
| Examiner Choi | 1.7 |
| Art Unit 2116 | 1.5 |
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Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.