| Examiner | Number of Cases | 3YGR |
|---|---|---|
| Examiner Bauman | 152 | 39% |
| Examiner Benitez (SPE) | 2 | 0% |
| Examiner Chen | 248 | 49% |
| Examiner Culbert | 168 | 40% |
| Examiner Diaz | 435 | 96% |
| Examiner Galvan | 0 | 0% |
| Examiner Harrison | 504 | 98% |
| Examiner Kim | 314 | 49% |
| Examiner Lee | 351 | 86% |
| Examiner Lee | 75 | 71% |
| Examiner Lin | 143 | 59% |
| Examiner Nelson | 33 | 88% |
| Examiner Wyatt | 3 | 0% |
| Art Unit 2815 | 2428 | 73% |
| Number | Class Description |
|---|---|
| 257 | Active solid-state devices (e.g., transistors, solid-state diodes) |
| 438 | Semiconductor device manufacturing: process |
| 428 | Stock material or miscellaneous articles |
| 702 | Data processing: measuring, calibrating, or testing |
| 361 | Electricity: electrical systems and devices |
| 219 | Electric heating |
| 349 | Liquid crystal cells, elements and systems |
| 362 | Illumination |
| 326 | Electronic digital logic circuitry |
| 348 | Television |
Art Unit 2815's grant rate is lower than that of Group 2810-2820 and lower than that of the USPTO.
Below is the grant rate timeline for Art Unit 2815, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.
Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.