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| Art Unit: | 2881 — Radiant energy |
|---|---|
| Group: | 2870-2880 — Optics/Photocopying |
| Classes: |
250 — Radiant energy 850 — Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g., scanning probe microscopy [spm] 378 — X-ray or gamma ray systems or devices 435 — Chemistry: molecular biology and microbiology 324 — Electricity: measuring and testing 702 — Data processing: measuring, calibrating, or testing 417 — Pumps 716 — Computer-aided design and analysis of circuits and semiconductor masks 118 — Coating apparatus 445 — Electric lamp or space discharge component or device manufacturing |
| Phone: | (571) 272-7438 |
| Email: | hsien.tsai@uspto.gov |
| Location: | VA 22314 |
| Title: | Pat Examnr Elctrl Engrg |
| Service: | 13 years |
| Grade: | GS-12 |
| 3-Year Grant rate: | 95% over 159 cases |
|---|---|
| Difficulty: | Extremely Easy |
| Difficulty Percentile: | 5th
|
With Examiner Tsai, you have a 95% chance of getting an issued patent by 3 years after the first office action. Examiner Tsai is an extremely easy examiner and in the 5th percentile across all examiners (with 100th percentile most difficult).
Below is the grant rate timeline for Examiner Tsai, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.
Examiner Tsai's grant rate is higher than that of Art Unit 2881 and higher than that of the USPTO.
| Average Office Actions Per Grant | |
|---|---|
| Examiner Tsai | 0.6 |
| Art Unit 2881 | 1.0 |
Examiner Tsai has granted 136 of 143 cases without any applicant-requested interviews for a grant rate of 95%.
Examiner Tsai has granted 15 of 16 cases with at least one applicant-requested interview for a grant rate of 94%.
With Examiner Tsai, conducting an interview decreases your chance of getting a patent granted by 1%.
| Number | Title | OA Rejections | Status | IFW |
|---|---|---|---|---|
| 18222510 | Detector | Rejection information available with a Premium Stats subscription. See our pricing. | Patented | View |
| 18243178 | Electron Microscope And Specimen Orientation Alignment Method | Patented | View | |
| 17844219 | Time-Of-Flight Mass Analysers | Patented | View | |
| 17923662 | Scintillator And Charged Particle Radiation Apparatus | Patented | View | |
| 17899772 | Light Source Apparatus | Patented | View | |
| 17916930 | De-Clustering Ion Guide | Patented | View | |
| 18296103 | Stage Device, Charged Particle Beam Device, And Vacuum Device | Patented | View | |
| 17923203 | Differential Pumping Apparatus And Focused Charged Particle Beam System | Patented | View | |
| 17836670 | Dual-Space, Single-Species Architecture For Trapped-Ion Quantum Information Processing | Patented | View | |
| 18327698 | Flow Recirculation For Mobility Separation Improvement | Patented | View | |
| 18451026 | Euv Source With Rotation Crucible And Laser And Tin (Sn) Auto-Filling Method | Patented | View | |
| 18283109 | Mass Spectrometry Methods And Systems For High Pressure Charge State Control And/or Fragmentation | Patented | View | |
| 18551211 | Mass Spectrometer And Method For Controlling Same | Patented | View | |
| 18340152 | Multiple Charged Particle Beam Writing Method And Multiple Charged Particle Beam Writing Apparatus | Patented | View | |
| 18024128 | Ion Spectrometer | Abandoned | View | |
| 17889176 | Ultraviolet Light Fixture | Abandoned | View | |
| 17962825 | Control Method Of Writing Apparatus And Writing Apparatus | Abandoned | View | |
| 18299749 | Coverage Calculating Method, Charged Particle Beam Writing Method, Coverage Calculating Device, Charged Particle Beam Writing Apparatus, And Computer-Readable Storage Medium | Patented | View | |
| 18143684 | System And Method For Ion Source Temperature Control Using Symmetric Or Asymmetric Application Of Force | Patented | View | |
| 18035916 | Analysis Device | Patented | View | |
| 18082543 | Mems Platform For Thin Film Nanomechanics Characterization | Patented | View | |
| 18007458 | A Gas Ion Gun | Patented | View | |
| 18131840 | Flow For High Resolution Stereoscopic Measurements | Patented | View | |
| 18050532 | Ion Sources For Improved Robustness | Patented | View | |
| 17876219 | Electrode Fabrication And Die Shaping For Metal-On-Glass Ion Traps | Patented | View | |
| 18148761 | Multi-Electron Beam Writing Apparatus And Multi-Electron Beam Writing Method | Patented | View | |
| 17852674 | Ion Funnels Having Improved Pressure Distribution And Flow Characteristics | Abandoned | View | |
| 17922823 | Charged Particle Beam Device And Sample Observation Method | Patented | View | |
| 17663085 | Hybrid Mass Spectrometry Apparatus | Patented | View | |
| 17925471 | Method For Ion/ion Reaction For Ion Mobility Mass Spectroscopy | Patented | View | |
| 17861076 | Curved Ion Mobility Architecture | Patented | View | |
| 17832577 | Plant Disinfection Apparatus | Abandoned | View | |
| 17866273 | Methods And Apparatuses For Barium States Preparations For Quantum Operations | Patented | View | |
| 18045666 | Methods And Apparatuses For Mapping State Preparation Error To Subspace Leakage Error | Patented | View | |
| 17906548 | Ion Guide Assembly Having Multiple Ion Guides | Patented | View | |
| 18021356 | Focused Ion Beam System | Patented | View | |
| 18536031 | Method And Systems Useful For Producing Aluminum Ions | Patented | View | |
| 17865559 | Device For Controlling Trapped Ions Having An Electrode Circuitry Configured For Device Testing | Patented | View | |
| 17941095 | Method For Rapid On-Site Detection Of Fentanyl Analogs Using A Miniature Mass Spectrometer | Patented | View | |
| 18816188 | Outer Source Assembly And Associated Components | Patented | View | |
| 17588048 | Automatic Particle Beam Focusing | Patented | View | |
| 17665302 | Cash Sanitization Or Sterlization Device | Patented | View | |
| 17756937 | Monitor For A Radiotherapy Device | Patented | View | |
| 17753922 | Electron Induced Dissociation Devices And Methods | Patented | View | |
| 17730916 | Methods Of Determining Aberrations Of A Charged Particle Beam, And Charged Particle Beam System | Patented | View | |
| 18045387 | Methods And Apparatuses For Reducing Phase Noise | Patented | View | |
| 17759087 | Method And System For The Identification Of Compounds In Complex Biological Or Environmental Samples | Abandoned | View | |
| 17934421 | Methods And Apparatuses For Electromagnetically-Induced Transparency Cooling In An Isotope With A Nuclear Spin Of 3/2 Or Greater | Patented | View | |
| 17831147 | Live-Assisted Image Acquisition Method And System With Charged Particle Microscopy | Patented | View | |
| 17627851 | Structure For Simulating A Thermal Image | Patented | View |
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