1. Stats
  2. USPTO
  3. TC 2800
  4. Group 2870-2880
  5. Art Unit 2881
  6. Examiner Logie

Examiner Logie Michael J

2881-LOGIE-MICHAEL-J

Employment Information

Art Unit:2881 — Radiant energy
Group:2870-2880 — Optics/Photocopying
Classes: 250 — Radiant energy
850 — Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g., scanning probe microscopy [spm]
356 — Optics: measuring and testing
204 — Chemistry: electrical and wave energy
252 — Compositions
428 — Stock material or miscellaneous articles
378 — X-ray or gamma ray systems or devices
Phone:(571) 270-1616
Email:michael.logie@uspto.gov
Location:VA 22314
Title:Pat Examnr Physics
Service:20 years
Grade:GS-14

Grant Rate and Difficulty Ranking

81
3-Year Grant rate: 50% over 250 cases
Difficulty: Very Hard
Difficulty Percentile: 81st

With Examiner Logie, you have a 50% chance of getting an issued patent by 3 years after the first office action. Examiner Logie is a very hard examiner and in the 81st percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Logie, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2881

Examiner Logie's grant rate is lower than that of Art Unit 2881 and lower than that of the USPTO.

Average Office Actions Per Grant
Examiner Logie 2.5
Art Unit 2881 1.0

Interview Benefit

Grant Rate without Interview

Examiner Logie has granted 75 of 161 cases without any applicant-requested interviews for a grant rate of 47%.

Grant Rate with Interview

Examiner Logie has granted 49 of 89 cases with at least one applicant-requested interview for a grant rate of 55%.

Interview Benefit

With Examiner Logie, conducting an interview increases your chance of getting a patent granted by 17%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
18100524 Collision Cell Having An Axial Field Rejection information available with a Premium Stats subscription. See our pricing. Abandoned View
18081689 Thermal Drift Correction Based On Thermal Modeling Abandoned View
18007322 Mass Spectrometer Abandoned View
17993886 Ion Source Structure Of Ion Implanter And Its Operation Method Abandoned View
17972427 Method For Creating A Smooth Diagonal Surface Using A Focused Ion Beam And An Innovative Scanning Strategy Abandoned View
18179530 Combined Device For Liquid-Phase Mass Spectrometry Sampling And Electrospray Abandoned View
17928991 Observation Device For Observation Target Gas, Method Of Observing Target Ions, And Sample Holder Abandoned View
18090950 Copper Iron Sensor Abandoned View
18075361 Disinfection Module Abandoned View
18091041 Xray Diffraction Angle Verification In An Ion Implanter Abandoned View
17694028 Variable Rotation Rate Batch Implanter Abandoned View
17685252 Radiation-Scintillated Shield And Manufacturing Method Of Radiation Shielding Resin Abandoned View
17254257 Structural Analysis Of Ionised Molecules Abandoned View
17730032 Characterizing Quadrupole Transmitting Window In Mass Spectrometers Patented View
18025123 Calibration And Tuning Method For Mass Spectrometer Abandoned View
18147263 Wien Filter And Multiple Electron Beam Inspection Apparatus Abandoned View
17799216 Electrospray Ion Source Assembly Patented View
17270485 Rf/dc Cutoff To Reduce Contamination And Enhance Robustness Of Mass Spectrometry Systems Abandoned View
17822177 Personal Radiation Protective Device Abandoned View
17684056 Desorption Ion Source With Post-Desorption Ionization In Transmission Geometry Patented View
18075492 Ultraviolet Sterilization Lamp Structure And Ultraviolet Sterilization Lamp Abandoned View
16184976 Communication Or Signaling System That Includes A Variable Pressure Activated Porous Volume Emitter Along With Related Methods Abandoned View
17153156 Sample Quantitation Using A Miniature Mass Spectrometer Patented View
17654707 E-Beam Position Tracker Abandoned View
17644364 Glycan Mass Spectrometry Data Analyzer And Program For Analyzing Glycan Mass Spectrometry Data Abandoned View
17312902 Fourier Transform Electrostatic Linear Ion Trap And Reflectron Time-Of-Flight Mass Spectrometer Abandoned View
17557700 Electron Microscope, Electron Source For Electron Microscope, And Methods Of Operating An Electron Microscope Abandoned View
18246096 Method For Evaluating Adhesion Reliability And Heat Radiation Performance Of Composite, And Composite Abandoned View
17270950 Method And Device For Sample Introduction For Mass Spectrometry Abandoned View
18084978 Method For Analyzing Metal Microparticles, And Inductively Coupled Plasma Mass Spectrometry Method Patented View
17422578 Direct Ionization In Imaging Mass Spectrometry Operation Abandoned View
17855655 Droplet Generator And Method Of Servicing Extreme Ultraviolet Imaging Tool Patented View
17737612 Analytical Device Abandoned View
17631186 Energy Filter For Use In The Implantation Of Ions Into A Substrate Patented View
17684456 Disinfection Device Patented View
16895522 Energy Degrader Enabling High-Speed Energy Switching Abandoned View
17617736 Electromagnetic Wave Protector Abandoned View
17490412 Methods And Systems For Elemental Mapping Abandoned View
17729817 Ultraviolet Lamp Tube Abandoned View
17227306 Device For Obtaining The Mass Of Single Nanoparticles, Viruses And Proteins In Suspension Or In Solution With High-Collection Efficiency Abandoned View
17607521 Method And Apparatus For Mass Spectrometry Abandoned View
17514262 Charge Filter Magnet With Variable Achromaticity Abandoned View
17666634 Laser Coaxial Ion Excitation Device Abandoned View
17301385 Multi-Mode Ionization Apparatus And Uses Thereof Patented View
17114312 Sample Supports For Solid-Substrate Electrospray Mass Spectrometry Patented View
17385498 System And Method For Sterilization Using Ultraviolet Radiation Patented View
15438863 Collimator And Energy Degrader Abandoned View
15438854 Collimator And Energy Degrader Abandoned View
17753035 Method For Mass Spectrometry Patented View
17642742 Static Electricity Recharging Device For A Used Mask Abandoned View

Appeals Statistics

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