Examiner Stafira Michael P

2877-STAFIRA-MICHAEL-P

Employment Information

Art Unit:2877 — Optics: measuring and testing
Group:2870-2880 — Optics/Photocopying
Classes: 356 — Optics: measuring and testing
382 — Image analysis
435 — Chemistry: molecular biology and microbiology
250 — Radiant energy
604 — Surgery
701 — Data processing: vehicles, navigation, and relative location
702 — Data processing: measuring, calibrating, or testing
700 — Data processing: generic control systems or specific applications
348 — Television
313 — Electric lamp and discharge devices
Phone:(571) 272-2430
Email:michael.stafira@uspto.gov
Location:VA 22314
Title:Pat Examnr Elctrl Engrg
Service:30 years
Grade:GS-14

Grant Rate and Difficulty Ranking

17
3-Year Grant rate: 91% over 594 cases
Difficulty: Very Easy
Difficulty Percentile: 17th

With Examiner Stafira, you have a 91% chance of getting an issued patent by 3 years after the first office action. Examiner Stafira is a very easy examiner and in the 17th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Stafira, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2877

Examiner Stafira's grant rate is higher than that of Art Unit 2877 and higher than that of the USPTO.

Average Office Actions Per Grant
Examiner Stafira 0.9
Art Unit 2877 1.2

Interview Benefit

Grant Rate without Interview

Examiner Stafira has granted 469 of 519 cases without any applicant-requested interviews for a grant rate of 90%.

Grant Rate with Interview

Examiner Stafira has granted 73 of 75 cases with at least one applicant-requested interview for a grant rate of 97%.

Interview Benefit

With Examiner Stafira, conducting an interview increases your chance of getting a patent granted by 8%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
18537880 Polarimetric Image Sensor Rejection information available with a Premium Stats subscription. See our pricing. Patented View
17724531 Apparatus And Method For Applying Bar Codes To Pellet-Shaped Articles Patented View
18302618 Communication Between An Optical Measuring Device And Two Measuring Cells Accommodated Therein Patented View
18282607 Biological Sample Analyzer And Flow Cytometer Patented View
17802857 Pre-Scan Focus And Scan Focus Methods Patented View
18752306 Electronic Devices With Relative Humidity Sensors Patented View
18686369 Method And System Of Sample Edge Detection And Sample Positioning For Image Inspection Apparatus Patented View
18032834 Extrinsic Fabry-Perot Absolute Pressure Sensor Patented View
18472997 Fiber Optic Profiler For Early Damage Warning Patented View
18564801 Three-Dimensional Measurement Device Patented View
18462206 Multi-Beam Smoke Detector Patented View
18258994 Method For Shape Sensing An Optical Fiber Patented View
18557688 Pinhole Detection Device Patented View
18677738 Fluorescence Imaging Of Gemstone On Transparent Stage Patented View
18460002 Wireless Sensor With Embedded Solar Panel And Interior Light Detector Patented View
18148616 Sensor And Band Pass Filter Patented View
18388094 Uv Inspection For Identifying Inadequate Coating On A Beverage Can Bottom Abandoned View
18398260 Information Processing Apparatus, Information Processing Method, And Non-Transitory Computer-Readable Storage Medium Patented View
18377381 Linear Polarization Component Detection System And Method Patented View
18274538 Emission Optical System, Emission Device, And Optical Measurement Device Patented View
18280497 Dispersion Stability Evaluation Method, And Dispersion Stability Comparison Method Patented View
18453416 Method For Assessing The Result Of A Surface Treatment Performed On A Workpiece By Particle Blasting Patented View
18530068 Radius Of Curvature (Roc) Determinations Based On Roc-Dependent Optical Conjugate Positions Patented View
18161599 Laser Gas Analyzer Patented View
18368261 Laser Radar Mounting Structure Patented View
18484854 Lamp System Capable Of Detecting Stereoscopic Shape Of Road Surface Patented View
18186900 Control Apparatus, Turbidimeter, Determination Method, And Learning Method Patented View
18361895 Optical Measurement Device Patented View
18036297 Inspection Apparatus And Inspection Method Patented View
18092807 Three-Dimensional Imaging System And Method Patented View
18091456 Powder-Free Intraoral Scanning And Imaging System Patented View
17827220 Determining The Critical Micelle Concentration Utilizing Sedimentation Velocity Profiles Abandoned View
18041279 Automated Optical Measurement System To Determine Semiconductor Properties Abandoned View
18159004 Optical Safety Device Patented View
18270648 Method And Device For Detecting Defects Of A Strand-Like Product Patented View
18562229 Devices And Methods For Determining Polarization Characteristics From Partial Polarimetry Patented View
18172383 Optical Interferometric Range Sensor Abandoned View
18503223 Optical Particle Characterization Apparatus Patented View
18275473 A Three-Dimensional Measuring Device Abandoned View
17628631 Photoelectric Detection And Acquisition System And Centroid Detection Method Based On Single-Pixel Detector Patented View
18253647 Apparatus And Method To Measure Direction And Polarization Of Electromagnetic Waves Patented View
17919584 Determination Apparatus Patented View
18268701 Polarimetry Abandoned View
18214156 Tomographic Refractive Index Profile Evaluation Of Non-Symmetrical Glass Fiber Preforms And Fibers Themselves Patented View
18169817 Robot Patented View
18242458 Support Ring Centering For Closure Inspection Patented View
18363481 8bit Conversion Patented View
17768510 Rectangular Cell For Photometric Analysis Abandoned View
17405631 Vehicular Floor Target Alignment For Sensor Calibration Abandoned View
18034875 Matrix-Based Characterization And Measurements For Semiconductor Thin-Film Material Patented View

Appeals Statistics

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