Examiner He Amy

2858-HE-AMY

Employment Information

Art Unit:2858 — Electricity: measuring and testing
Group:2850-2860 — Printing/Measuring and Testing
Classes: 324 — Electricity: measuring and testing
600 — Surgery
506 — Combinatorial chemistry technology: method, library, apparatus
607 — Surgery: light, thermal, and electrical application
Phone:(571) 272-2230
Email:amy.he@uspto.gov
Location:VA 22314
Title:Pat Examnr Elctrl Engrg
Service:24 years
Grade:GS-14

Grant Rate and Difficulty Ranking

26
3-Year Grant rate: 87% over 186 cases
Difficulty: Easier
Difficulty Percentile: 26th

With Examiner He, you have a 87% chance of getting an issued patent by 3 years after the first office action. Examiner He is an easier examiner and in the 26th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner He, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2858

Examiner He's grant rate is lower than that of Art Unit 2858 and higher than that of the USPTO.

Average Office Actions Per Grant
Examiner He 1.0
Art Unit 2858 1.1

Interview Benefit

Grant Rate without Interview

Examiner He has granted 136 of 155 cases without any applicant-requested interviews for a grant rate of 88%.

Grant Rate with Interview

Examiner He has granted 26 of 31 cases with at least one applicant-requested interview for a grant rate of 84%.

Interview Benefit

With Examiner He, conducting an interview decreases your chance of getting a patent granted by 5%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
18291179 Electric Potential Measurement System For Continuously Measuring The Electric Potential Of The Ground Rejection information available with a Premium Stats subscription. See our pricing. Patented View
18553086 A System, Device And Method For Detection And Identification Of Species In A Sample With An Ionic Exchange Membrane Patented View
18068557 Technologies For Verifying And Validating Electronic Devices Using Electroluminescence Patented View
17861481 Capacitive Sensor And Method For Planar Recognition Of An Approach Patented View
18032194 Capacitive Angle-Of-Rotation Measurement System And Method For Adapting A Capacitive Angle-Of-Rotation Measurement System Patented View
18030438 Operating Method For A Group Of Pressure Sensors Patented View
18300870 Test Board And Test Method For Semiconductor Device Using The Same Patented View
18565954 Measurement System And Method Of Electric Permittivity At 0 Hz Patented View
18523916 Steering Device Patented View
18037011 Low-Cost, High Measurement Speed Capacitive Sensing Circuit For Loading Mode Operation Of Capacitive Sensors Patented View
17757629 Local Partial Discharge Monitoring Patented View
17880020 Systems And Devices For Wheel Sensors Patented View
17980429 Single-Capacitor Inductive Sense Systems Patented View
18997293 Soil Carbon Sensor And Sensing Arrangement Patented View
18615863 System For Measuring And Calibrating Touch, Force, And Haptic Output At A Touch Sensor Patented View
17946982 Test Apparatus For Test Cards Patented View
18221094 Load Pull Tuning Probe With Adjustable Notch Patented View
18185156 Method, System And Probe For Measuring And Visualizing Values Of An Electromagnetic Parameter Of A Pcb Patented View
17820175 Capacitance Measuring System And Method Patented View
17595743 A Method For Use In Measuring A Property Of An Automobile Component Patented View
18301173 Hydrogel-Based Ph Sensors And Use Thereof Patented View
18696930 Touch Sensing System Patented View
18026517 Display Substrates, Display Apparatuses And Methods Of Detecting Cracks In Display Substrates Patented View
18037315 Charging And Discharging Jig For Impedance Measurement Of Battery Cell Patented View
17996442 Method And Apparatus For Determining Gate Capacitance Patented View
18125579 Partial Discharge Detecting Method Using Ultraviolet Imagery Under Pulse Voltage Condition Patented View
18023911 Estimating Magnetic Field Using A Network Of Satellites Patented View
17894227 Apparatus For Determination Of Capacitive And Resistive Characteristics Of Access Lines Patented View
17817796 Leadless Current Sensor Package With High Isolation Patented View
18331151 Power Generation Sensor Patented View
17813633 System And Method Of Measuring Capacitance Of Device-Under-Test Patented View
18024099 Fault Gas Detection System For A Liquid Filled High Voltage Transformer Patented View
18286627 Partial Pressure Gauge Assembly For Process Contaminant Detection Using Photoionization And Associated Method Patented View
18047843 Deriving A Capacitance-Ratio Information, Device And Method Patented View
17859000 Apparatus And Method For Inspecting Electrostatic Chuck Patented View
17769994 Capacitive Intelligent Workstation Detection System Abandoned View
17796151 Measurement Individual Difference Correction System In Ground Voltage Measurement Patented View
17455728 Human Body Sensor System Using Signal Phase Shift Patented View
18213450 Conductivity Measurement Device Patented View
17793170 Capacitance Detection Circuit Abandoned View
17659649 Core Electrodes Based On Multiple Rod, And Underwater Electric Field Sensor Electrodes And Underwater Electric Field Sensor Having The Same Patented View
17213163 Housing, Housing Assembly, Mechanical Arm, And Robot Of Mechanical Equipment Patented View
17837055 Ring Oscillator And Test Method Patented View
17122252 Guided Wave Radar Level Gauge And Method For Controlling The Guided Wave Radar Level Gauge Patented View
18284352 Capacitive Proximity Sensor Patented View
17649053 Apparatus, Methods, And Techniques Of Obscured Feature Detection With Live Wire Detection Patented View
17733377 Circuit For Transferring Data From One Clock Domain To Another Patented View
18011426 Current Separation Method, Doping Method, And Doping Apparatus Of Nonaqueous Lithium Power Storage Element Patented View
17824782 Label-Free Monitoring Of Excitation-Contraction Coupling And Excitable Cells Using Impedance Based Systems With Millisecond Time Resolution Abandoned View
17569680 Wide-Bandgap Semiconductor Layer Characterization Patented View

Appeals Statistics

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