Examiner Eman A Alkafawi

Employment Information

Group:Printing/Measuring and Testing
Classes: 073 — Measuring and testing
324 — Electricity: measuring and testing
356 — Optics: measuring and testing
702 — Data processing: measuring, calibrating, or testing
Art Unit:2865
Title:Patent Examiner
Phone:(571) 272-4448
Degree:Master's Degree
Service:7 years

Grant Rate and Difficulty Ranking

3-Year Grant rate:41% over 170 cases
Difficulty: Harder
Difficulty Percentile: 77th

With Examiner Alkafawi, you have a 41% chance of getting an issued patent by 3 years after the first office action. Examiner Alkafawi is a harder examiner and in the 77th percentile across all examiners (with 100th percentile most difficult).

Grant Rate Timeline

Below is the grant rate timeline for Examiner Alkafawi, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.


Comparison with Art Unit 2865

Examiner Alkafawi's grant rate is lower than that of Art Unit 2865 and lower than that of the USPTO.


Grant Rate without Interview

Examiner Alkafawi has granted 34 of 94 cases without any applicant-requested interviews for a grant rate of 36%.


Grant Rate with Interview

Examiner Alkafawi has granted 36 of 76 cases with at least one applicant-requested interview for a grant rate of 47%.


Interview Benefit

With Examiner Alkafawi, conducting an interview increases your chance of getting a patent granted by 31%.


Recent Dispositions

US20150106035A1 Methods Of Selecting Material Compositions And Designing Materials Having A Target Property Patented View
US20170176615A1 Method For Processing Seismic Images Patented View
US20130006555A1 Method And Apparatus For Measuring The Power Of A Power Generator While Operating In Variable Frequency Mode And/or While Operating In Pulsing Mode Abandoned View
US20160047647A1 Safety Monitoring For A Serial Kinematic System Patented View
US20170082776A1 System And Methods For Obtaining Compensated Electromagnetic Measurements Patented View
US20140360264A1 Method And Measuring Device For Fill Level Measurement Patented View
US20170082668A1 Measuring Apparatus, Measuring Method, And Recording Medium Abandoned View
US20180128929A1 System And Method For Porosity Estimation In Low-Porosity Subsurface Reservoirs Patented View
US20120136623A1 Locating A Device Using A Reference Point To Align Location Information Patented View
US20130103341A1 Test Fixture For Testing Set-Top Boxes Patented View

Appeals Statistics Available with Subscription

We have history of 47 appeals for this examiner. Please subscribe for full access to appeals statistics.

Appeals Statistics Available with Subscription

We have history of 47 appeals for Examiner Alkafawi. Please subscribe for full access to appeals statistics.

See our appeals statistics for this tech center for an example of our appeals statistics.

Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.