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| Art Unit: | 2176 — Data processing: presentation processing of document, operator interface processing, and screen saver display processing |
|---|---|
| Group: | 2170 — GUI, Document Processing, Power and Other |
| Classes: |
710 — Electrical computers and digital data processing systems: input/output 713 — Electrical computers and digital processing systems: support 700 — Data processing: generic control systems or specific applications 375 — Pulse or digital communications 323 — Electricity: power supply or regulation systems 717 — Data processing: software development, installation, and management 347 — Incremental printing of symbolic information 702 — Data processing: measuring, calibrating, or testing 326 — Electronic digital logic circuitry 718 — Electrical computers and digital processing systems: virtual machine task or process management or task management/control |
| Phone: | (571) 272-3639 |
| Email: | paul.myers@uspto.gov |
| Location: | VA 22314 |
| Title: | Pat Examnr Elctrl Engrg |
| Service: | 32 years |
| Grade: | GS-14 |
| 3-Year Grant rate: | 88% over 287 cases |
|---|---|
| Difficulty: | Easier |
| Difficulty Percentile: | 24th
|
With Examiner Myers, you have a 88% chance of getting an issued patent by 3 years after the first office action. Examiner Myers is an easier examiner and in the 24th percentile across all examiners (with 100th percentile most difficult).
Below is the grant rate timeline for Examiner Myers, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.
Examiner Myers's grant rate is higher than that of Art Unit 2176 and higher than that of the USPTO.
| Average Office Actions Per Grant | |
|---|---|
| Examiner Myers | 1.3 |
| Art Unit 2176 | 1.7 |
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Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.