1. Stats
  2. USPTO
  3. TC 2100
  4. Group 2120-2140
  5. Art Unit 2126
  6. Examiner Ahmed

Examiner Ahmed Syed R

2126-AHMED-SYED-R

Employment Information

Art Unit:2126 — Data processing: artificial intelligence
Group:2120-2140 — Artificial Intelligence
Classes: 706 — Data processing: artificial intelligence
700 — Data processing: generic control systems or specific applications
709 — Electrical computers and digital processing systems: multicomputer data transferring
Phone:(571) 270-0286
Email:None
Location:None
Title:Patent Examiner Computer Science
Service:2 years
Grade:GS-07

Grant Rate and Difficulty Ranking

3-Year Grant rate: 0% over 2 cases
Difficulty: Not enough data to rank
Difficulty Percentile:

With Examiner Ahmed, you have a 0% chance of getting an issued patent by 3 years after the first office action.

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Ahmed, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2126

Examiner Ahmed's grant rate is lower than that of Art Unit 2126 and lower than that of the USPTO.

Average Office Actions Per Grant
Examiner Ahmed 1.0
Art Unit 2126 2.4

Interview Benefit

Grant Rate without Interview

Examiner Ahmed has granted 0 of 2 cases without any applicant-requested interviews for a grant rate of 0%.

Grant Rate with Interview

Examiner Ahmed has granted 0 of 0 cases with at least one applicant-requested interview for a grant rate of 0%.

Interview Benefit

With Examiner Ahmed, conducting an interview increases your chance of getting a patent granted by 100%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
17345702 Image Classifier Comprising A Non-Injective Transformation Rejection information available with a Premium Stats subscription. See our pricing. Patented View
17120392 Systems And Methods For Labeling Data Abandoned View
19172881 Predictive System For Semiconductor Manufacturing Using Generative Large Language Models Abandoned View
18757237 Pre-Fetching Random-Value Resource Locators Abandoned View
16011122 Systems And Methods For Adaptive Noise Management Abandoned View
15236431 Control System Used For Precision Agriculture And Method Of Use Abandoned View

Appeals Statistics

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Disclaimer: We do not provide any guarantees as to the accuracy of the statistics presented above and under
no circumstances will we be liable for any outcome resulting from your reliance on the above statistics.