Examiner Culbert Roberts P

1716-CULBERT-ROBERTS-P

Employment Information

Art Unit:1716 — Coating apparatus
Group:1710 — Coating, Etching, Cleaning, Single Crystal Growth
Classes: 438 — Semiconductor device manufacturing: process
216 — Etching a substrate: processes
252 — Compositions
156 — Adhesive bonding and miscellaneous chemical manufacture
118 — Coating apparatus
206 — Special receptacle or package
365 — Static information storage and retrieval
600 — Surgery
430 — Radiation imagery chemistry: process, composition, or product thereof
264 — Plastic and nonmetallic article shaping or treating: processes
Phone:(571) 272-1433
Email:roberts.culbert@uspto.gov
Location:VA 22314
Title:Pat Examnr Cheml Engrg
Service:24 years
Grade:GS-14

Grant Rate and Difficulty Ranking

14
3-Year Grant rate: 92% over 453 cases
Difficulty: Very Easy
Difficulty Percentile: 14th

With Examiner Culbert, you have a 92% chance of getting an issued patent by 3 years after the first office action. Examiner Culbert is a very easy examiner and in the 14th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Culbert, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 1716

Examiner Culbert's grant rate is higher than that of Art Unit 1716 and higher than that of the USPTO.

Average Office Actions Per Grant
Examiner Culbert 0.7
Art Unit 1716 1.7

Interview Benefit

Grant Rate without Interview

Examiner Culbert has granted 394 of 422 cases without any applicant-requested interviews for a grant rate of 93%.

Grant Rate with Interview

Examiner Culbert has granted 24 of 31 cases with at least one applicant-requested interview for a grant rate of 77%.

Interview Benefit

With Examiner Culbert, conducting an interview decreases your chance of getting a patent granted by 17%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
17879418 Apparatus And Methods For Selectively Etching Silicon Oxide Films Rejection information available with a Premium Stats subscription. See our pricing. Patented View
18459173 Slurry Composition For A Chemical Mechanical Polishing Patented View
18254787 Photoresist Development With Organic Vapor Patented View
18362608 Method For Lateral Etch With Bottom Passivation Patented View
18098112 Etching Method And Etching Apparatus Patented View
18127668 Etching Method And Plasma Processing System Patented View
18004051 Selective Silicon Trim By Thermal Etching Patented View
18213700 Substrate Processing Method And Substrate Processing Apparatus Patented View
18096035 Etching Method And Plasma Processing Apparatus Patented View
17861691 Carbon Hardmask Opening Using Boron Nitride Mask Patented View
18160730 Etching Method And Etching Apparatus Patented View
18592994 Plasma Etching Chemistries Of High Aspect Ratio Features In Dielectrics Patented View
18534327 Wafer Total Thickness Variation Using Maskless Implant Patented View
18447943 Plasma-Assisted Etching Of Metal Oxides Patented View
18243776 Electro-Optic Thz Emitter And Receiver Devices And Method Of Fabrication Patented View
18513489 Sulfur-Containing Molecules For High Aspect Ratio Plasma Etching Processes Patented View
17921343 Automated Feedforward And Feedback Sequence For Patterning Cd Control Patented View
17203925 Barrier Chemical Mechanical Planarization Slurries For Cobalt Films Patented View
18560852 Liquid Dispersion And Powder Of Cerium Based Core-Shell Particles, Process For Producing The Same And Uses Thereof In Polishing Patented View
18244863 Plasma Etching Apparatus Component For Manufacturing Semiconductor Comprising Composite Sintered Body And Manufacturing Method Therefor Patented View
18022929 Cerium Oxide Particles, Chemical Mechanical Polishing Slurry Composition Comprising Same, And Method For Manufacturing Semiconductor Device Patented View
18850990 Integration Of Dry Development And Etch Processes For Euv Patterning In A Single Process Chamber Patented View
18095279 Directional Selective Fill For Silicon Gap Fill Processes Patented View
18330501 Plasma Processing Method And Plasma Processing Apparatus Patented View
18136407 Methods Of Manufacturing Semiconductor Devices Including A Repeating Pattern Of Lines And Spaces Patented View
18166879 Methods For Forming Spacers And Related Structures Patented View
18673409 Chemical Liquid And Chemical Liquid Storage Body Patented View
18279827 Plasma Processing Method Patented View
18026095 Etching Processing Method Patented View
18297152 Composition For Semiconductor Processing And Polishing Method Of Semiconductor Device Using The Same Patented View
18388240 Methods For Forming Vertically Layered Ionic Liquid Crystal (Ilc) Structures On A Semiconductor Substrate Patented View
18255783 Polishing Composition For Semiconductor Processing Polishing Composition Preparation Method, And Semiconductor Device Manufacturing Method To Which Polishing Composition Is Applied Patented View
18258555 Polishing Composition And Method Of Polishing Silicon Wafer Patented View
17846929 Polishing Of Transition Metals Patented View
17302850 Tin Oxide Films In Semiconductor Device Manufacturing Patented View
18124593 Etching Method And Plasma Processing System Patented View
18096032 Etching Method And Plasma Processing Apparatus Patented View
18400180 Processing Method, Method Of Manufacturing Semiconductor Device, Processing Apparatus, And Recording Medium Patented View
18168448 Polishing Composition, Polishing Method, And Method Of Manufacturing Semiconductor Substrate Patented View
17878132 Substrate Processing Apparatus And Substrate Processing Method Patented View
17875524 Temperature-Controlled Plasma Generation System Patented View
18112302 Plasma Processing Method And Plasma Processing System Patented View
17288498 Optical Waveguide Connecting Device Patented View
18125936 Method For Forming Photoresist Pattern And Method For Forming Pattern On A Substrate Patented View
18247669 Etching Method And Etching Apparatus Patented View
18137131 Identification Codes On Semiconductor Chips Patented View
18671779 Surface Treatment Of A Sulfide Glass Solid Electrolyte Layer Patented View
18028262 Recess Filling Method And Substrate Processing Apparatus Patented View
18269616 Polycrystalline Sic Compact And Method For Manufacturing The Same Patented View
18156917 In-Situ Focus Ring Coating Patented View

Appeals Statistics

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