Examiner Kendall Benjamin R

2896-KENDALL-BENJAMIN-R

Employment Information

Art Unit:2896 — Active solid-state devices (e.g., transistors, solid-state diodes)
Group:2800 Search — Search and Classification
Classes: 118 — Coating apparatus
156 — Adhesive bonding and miscellaneous chemical manufacture
438 — Semiconductor device manufacturing: process
427 — Coating processes
Phone:(571) 272-5081
Email:benjamin.kendall@uspto.gov
Location:VA 22314
Title:Pat Examnr
Service:14 years
Grade:GS-14

Grant Rate and Difficulty Ranking

90
3-Year Grant rate: 30% over 156 cases
Difficulty: Very Hard
Difficulty Percentile: 90th

With Examiner Kendall, you have a 30% chance of getting an issued patent by 3 years after the first office action. Examiner Kendall is a very hard examiner and in the 90th percentile across all examiners (with 100th percentile most difficult).

Grant Rate

Grant Rate Timeline

Below is the grant rate timeline for Examiner Kendall, where the timeline is relative to the date of the first office action. The three-year grant rate is the percentage of applications granted at three years after the first office action.

Comparison with Art Unit 2896

Examiner Kendall's grant rate is lower than that of Art Unit 2896 and lower than that of the USPTO.

Average Office Actions Per Grant
Examiner Kendall 2.1
Art Unit 2896 1.2

Interview Benefit

Grant Rate without Interview

Examiner Kendall has granted 20 of 70 cases without any applicant-requested interviews for a grant rate of 29%.

Grant Rate with Interview

Examiner Kendall has granted 27 of 86 cases with at least one applicant-requested interview for a grant rate of 31%.

Interview Benefit

With Examiner Kendall, conducting an interview increases your chance of getting a patent granted by 7%.

Recent Dispositions

Recent Dispositions

Number Title OA Rejections Status IFW
18272994 Molecular Beam Epitaxy Thin Film Growth Apparatus Rejection information available with a Premium Stats subscription. See our pricing. Patented View
17904321 Plasma Processing Device And Plasma Processing Method Patented View
17709301 Chemical-Dose Substrate Deposition Monitoring Patented View
18224070 Plasma Processing Apparatus And Temperature Controlling Method Patented View
18206659 Micro-Capillary High Voltage Isolator For Gas Delivery To Vacuum Patented View
17885488 Semiconductor Processing Station And Semiconductor Process Using The Same Patented View
18349557 Focus Ring And Plasma Etching Device Including Same Patented View
17977440 Apparatus For Treating Substrate And Method For Treating Substrate Patented View
17713232 Substrate Processing Apparatus Patented View
17913935 Plasma-Exclusion-Zone Rings For Processing Notched Wafers Patented View
17833408 Throttle Valve And Foreline Cleaning Using A Microwave Source Patented View
17979291 Plasma Source And Plasma Processing Apparatus Patented View
17763915 Treating Arrangement With Loading/unloading Group And Epitaxial Reactor Patented View
17763890 Treating Arrangement With Transfer Chamber And Epitaxial Reactor Patented View
17763933 Treating Arrangement With Storage Chamber And Epitaxial Reactor Patented View
18029641 Faceless Showerhead Patented View
17842222 Substrate Treating Apparatus And Substrate Treating Method Patented View
17495760 Plasma Processing Apparatus And Plasma Processing Coil Patented View
17911992 Showerhead Purge Collar Abandoned View
18013493 Profile Twisting Control In Dielectric Etch Patented View
17686609 Gas Treatment Apparatus Patented View
17661848 Apparatus For Edge Control During Plasma Processing Patented View
17682745 Substrate Processing Device, Substrate Processing Method, And Method For Manufacturing Semiconductor Device Patented View
17931230 Semiconductor Manufacturing Apparatus And Semiconductor Device Manufacturing Method Abandoned View
18005216 Substrate Processing Apparatus, And Waterproofing Device For Acoustic Sensor Abandoned View
17545130 Support Unit And Apparatus For Treating Substrate Patented View
17352383 Plasma Processing System, Plasma Processing Apparatus, And Method For Replacing Edge Ring Patented View
17337067 Plasma Processing Apparatus With Tunable Electrical Characteristic Patented View
18413728 Substrate Processing Apparatus Abandoned View
16812075 Capacitive Sensors And Capacitive Sensing Locations For Plasma Chamber Condition Monitoring Patented View
17817338 Plasma Processing Apparatus And Semiconductor Device Manufacturing Method Patented View
17702105 Deposition Apparatus Abandoned View
18022550 Apparatus For Treating Substrate And Method For Aligning Dielectric Plate Using The Same Patented View
17696594 Integrated Showerhead Patented View
18088828 Techniques And Apparatus For Selective Shaping Of Mask Features Using Angled Beams Patented View
17354879 Vented Susceptor Patented View
17704844 Temperature Controller, Substrate Processing Apparatus, And Pressure Control Method Patented View
17904774 Semiconductor Processing Chamber With Dual-Lift Mechanism For Edge Ring Elevation Management Patented View
17426965 Textured Silicon Semiconductor Processing Chamber Components Abandoned View
17987259 Multi-Antenna Unit For Large Area Inductively Coupled Plasma Processing Apparatus Patented View
18245543 Collection Assembly And Semiconductor Pre-Cleaning Chamber Patented View
18087187 Hermetic Tubular Linear Motor Based Wafer Lift Actuator Patented View
17701673 Plasma Processing System And Method Of Mounting Annular Member Patented View
16418274 Process Chamber Process Kit With Protective Coating Patented View
17469895 Etching Method And Plasma Processing Apparatus Patented View
17412969 Pressure Control System For A Multi-Head Processing Chamber Of A Plasma Processing Apparatus Patented View
18210318 Substrate Processing Apparatus And Temperature Regulation Method Patented View
15981089 Semiconductor Processing Chamber For Improved Precursor Flow Patented View
18413533 Exhaust Component Cleaning Method And Substrate Processing Apparatus Including Exhaust Component Abandoned View
17697023 Film Forming Apparatus Patented View

Appeals Statistics

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